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NVMe SSD constant-temperature reliability testing method and device

A testing method and testing device technology, which are applied in the directions of reliability/usability analysis, neural learning method, error detection/correction, etc., can solve the problems of difficult constant temperature, inaccurate NVMESSD reliability test results, etc. Test complexity and rich application scenarios

Pending Publication Date: 2021-11-05
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In view of the above existing method of changing the ambient temperature to control the reliability test of the NVMe SSD disk to be tested at a constant temperature, it is difficult to achieve a real constant temperature, resulting in inaccurate reliability test results of the NVME SSD. , the present invention provides a NVMe SSD constant temperature reliability testing method and device to solve the above technical problems

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  • NVMe SSD constant-temperature reliability testing method and device
  • NVMe SSD constant-temperature reliability testing method and device

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Embodiment 1

[0076] like figure 1 As shown, the present invention provides an FIO-based NVME SSD constant temperature reliability test method, including the following steps:

[0077] The relationship model of NVME SSD temperature value and FIO workload is determined by artificial neural network algorithm;

[0078] S2. Get the desired constant temperature value of NVME SSD, and calculate the required FIO workload by the NVME SSD temperature value and the relationship model of the FIO workload;

[0079] S3. Reliability test of the NVME SSD runs the required FIO workload through the FIO tool, and detects the real-time temperature value of NVME SSD by the NVME SSD during the test process, and the real-time temperature value and the location When the constant temperature value does not match, the real-time FIO workload is adjusted according to the NVME SSD temperature value and the relationship model of the FIO workload.

Embodiment 2

[0081] like figure 2 As shown, the present invention provides an FIO-based NVME SSD constant temperature reliability test method, including the following steps:

[0082] S1. Determine the relationship model of NVME SSD temperature value and FIO workload by artificial neural network algorithm; the specific steps are as follows:

[0083] S11. Based on artificial neural network algorithm, the primary relationship model of NVME SSD temperature value and the FIO workload is used as the input layer, and the FIO workload is used as an implicit layer, and the NVMESSD temperature value is used as the output layer; FIO parameters include read and write Mode, IO block size, number of work threads, and IO queue depth; read and write mode includes sequential write mode, sequential read mode, random write mode, random read mode, sequential hybrid read and write mode, and random hybrid read and write mode; IO block size The range is more than 4K, less than the NVME SSD capacity value; the number...

Embodiment 3

[0098] like figure 2 As shown, the present invention provides an NVME SSD constant temperature reliability test method, including the following steps:

[0099] S1. Determine the relationship model of NVME SSD temperature value and FIO workload by artificial neural network algorithm; the specific steps are as follows:

[0100] S11. Based on the artificial neural network algorithm to create the primary relationship model of the NVME SSD temperature value and the FIO workload, with the FIO parameter as the input layer, the FIO workload is used as an implicit layer, and the NVMESSD temperature value is used as the output layer; the specific steps are as follows:

[0101]S111. Based on the artificial neural network algorithm, the FIO parameter is used as the input layer, the NVME SSD temperature value is used as an output layer with the NVME SSD temperature value as an output layer, and the primary relationship model of the FIO workload is created. Including read and write mode, IO blo...

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Abstract

The invention provides an NVMe SSD constant-temperature reliability testing method and device. The method comprises the following steps of determining a temperature value and FIO work load relation model through an artificial neural network algorithm; acquiring a required constant temperature value, and calculating a required FIO working load through a temperature value and FIO working load relation model; carrying out reliability test on an FIO working load required by NVMe SSD operation through an FIO tool, detecting a real-time temperature value through an NVMe CLI tool every set time period in the test process, and adjusting the real-time FIO working load according to a temperature value and FIO working load relation model when the real-time temperature value is not matched with a required constant temperature value. According to the method, the model of the corresponding relation between the temperature value of the NVMe SSD and the FIO work is determined through the artificial neural network algorithm, so that the reliability test of the NVMe SSD at the constant temperature is realized, and the test complexity is increased.

Description

Technical field [0001] The present invention belongs to the technical field of hard disk reliability testing, and more particularly to a NVME SSD constant temperature reliability test method and apparatus. Background technique [0002] NVME, is a referred to as Non-Volatile Memory Express, non-volatile storage. [0003] SSD is a referusion of Solid State Drive, a solid state drive. [0004] RDT is a referred to as the Reliability DemonStration Tests, reliability test. [0005] FIO, is an I / O tool for pressure testing and verification of hardware, supporting 13 different I / O engines. [0006] The existing NVME SSD RDT test is to control the temperature of the NVME SSD disk by changing ambient temperature, so that the NVME SSD disk performs the reliability test of NVME SSD at the constant desired temperature at a constant temperature. The way is first difficult to accurately control temperature, and people are more participating parts, and the possibility of generating interfer...

Claims

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Application Information

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IPC IPC(8): G06F11/00G06F11/30G06N3/04G06N3/08
CPCG06F11/008G06F11/3037G06F11/3058G06F11/3051G06N3/084G06N3/045Y02D10/00
Inventor 刘迎
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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