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A method for measuring capacitance value in high voltage environment

A high-voltage environment, capacitance value technology, applied in the direction of capacitance measurement, measuring device, measuring electrical variables, etc., can solve the problems of unable to meet the test requirements, large equipment volume, and unable to meet the test requirements of thousands of volts

Active Publication Date: 2022-01-25
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the LCR tester can guarantee high measurement accuracy, the equipment is bulky and the operation is complicated. The maximum voltage that can be measured is 2 V, which cannot meet the test requirements of thousands of volts in a high-voltage environment.
Capacitance bridge tester is quick and easy to use, stable in performance and high in measurement accuracy, but the maximum voltage it can provide for measurement is 26 V, which also cannot meet the actual test requirements

Method used

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  • A method for measuring capacitance value in high voltage environment
  • A method for measuring capacitance value in high voltage environment
  • A method for measuring capacitance value in high voltage environment

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Embodiment 1

[0039] This embodiment proposes a capacitance measurement method in a high-voltage environment, the process is as follows figure 1 shown, including the following steps:

[0040] S1: Use a voltmeter and an oscilloscope to obtain the capacitance C to be measured X The parameters of the high-voltage environment, including DC bias voltage, voltage amplitude and voltage frequency;

[0041] S2: build as figure 2 The shown voltage and current measurement circuit consists of a high-voltage DC bias unit, a high-frequency transformer unit and a discharge unit connected in series, and the measured capacitance C X Connect in parallel with the discharge unit to measure the capacitance C X The voltage and current of the corresponding primary side of the high-frequency transformer unit; where, such as image 3 as shown,

[0042] The high-voltage DC bias unit includes a high-voltage DC stabilized power supply, a resistor R, and a capacitor C connected in series, and the two ends of the ...

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Abstract

The invention provides a method for measuring capacitance value in a high-voltage environment, which belongs to the technical field of capacitance measurement. Firstly, the parameters of the high-voltage environment where the capacitor to be tested is obtained are obtained, and then a high-voltage DC bias unit, a high-frequency transformer unit, and a voltage transformer unit to be tested are constructed. A voltage and current measurement circuit in which the discharge units connected in parallel are connected in series; an adjustable capacitor is connected to the voltage and current measurement circuit as the capacitor to be measured to obtain a reference working curve; after the capacitor to be measured is connected, the discharge unit is disconnected to start the high-voltage DC voltage regulator Power supply to high voltage output, start the high-frequency transformer unit to measure the voltage and current of the primary side, turn off the high-voltage DC stabilized power supply and high-frequency transformer unit, and connect the discharge unit; according to the corresponding voltage and current of the capacitor to be measured in the reference working curve Find the optional capacitance value as the capacitance value of the capacitor under test in a high voltage environment. The invention ensures that the working state of the circuit is consistent when obtaining the reference working curve and measuring the capacitance to be measured, and realizes high-precision capacitance value measurement in a high-voltage environment.

Description

technical field [0001] The invention belongs to the technical field of capacitance measurement, and in particular relates to a method for measuring capacitance value in a high-voltage environment. Background technique [0002] High-voltage capacitors are widely used in ignition, X-ray, large substation and other equipment. In a high-voltage environment of 1.5~20 kV, the capacitance of the capacitor will change. Due to the lack of an effective capacitance measurement method in a high-voltage environment, the current circuit design often regards the capacitance value as a constant, resulting in large deviations in circuit parameters and difficult calibration. Traditional capacitance measurement instruments are mainly used for measurement in low-voltage environments, such as LCR testers, capacitance bridge testers, etc. Although the LCR tester can guarantee high measurement accuracy, the equipment is large in size and complicated to operate. The maximum voltage that can be pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
CPCG01R27/2605
Inventor 何鹏白利兵周权张旭张杰程玉华
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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