A single-event upset-resistant asynchronous frequency division circuit with self-refresh function

Abstract

The present invention is an asynchronous frequency division circuit with self-refresh function and anti-single event reversal effect, which includes a majority voting circuit and a parallel three-stage counting frequency division module, and the counting frequency division module includes a frequency division number configuration circuit and a counter circuit. The use of redundant structure, majority voting circuit and self-refresh method greatly improves the anti-single event flipping effect of the asynchronous frequency division circuit; the single event flipping event in a single frequency division circuit is suppressed through redundant voting, and the output frequency is output after utilizing the majority voting The signal performs real-time refresh control on the three counting frequency division modules to ensure that the three counting frequency division modules work in the same state, eliminating the accumulation of timing error states caused by the single event flip effect in the counting frequency division module, and greatly reducing the asynchronous frequency division circuit. The single event flip probability improves the reliability of integrated circuits in space application environments.

Description

technical field [0001] The invention relates to the field of semiconductor integrated circuits, in particular to an asynchronous frequency division circuit with self-refresh function and anti-single event reversal effect. Background technique [0002] Frequency division circuits are widely used in the field of integrated circuit design, such as SoC chips, DSP chips, application-specific integrated circuits, phase-locked loops, and digital-to-analog converters, to achieve frequency division of various signals such as clock, data, and control. Due to the characteristics of the structure of the semiconductor integrated circuit, the frequency division circuit is extremely susceptible to the interference of space electrons, protons, photons, alpha particles, and heavy ions in the space radiation environment, resulting in a single event flip effect, resulting in an error in the state of the frequency division circuit. It affects the normal operation of electronic components, and i...

AI Technical Summary

Problems solved by technology

On the same principle, other digital frequency division circuits used in digital circuits also have similar single event flipping problems, which reduces the reliability of digital integrated circuits working in space radiation environments

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