Burr detection method and system under high sampling rate
A technology of high-speed sampling and detection method, applied in the direction of optical testing flaws/defects, etc., can solve the problems of narrow glitch pulse width, unable to realize ps-level pulse width detection, etc., and achieve the effect of accurate glitch detection
Pending Publication Date: 2021-12-03
UESTC (SHENZHEN) ADVANCED RES INST
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[0005] However, as the operating frequency of the digital system becomes faster and faster, the pulse width of the glitch pulse becomes narrower and narrower. Due to the limitation of the working clock of the flip-flop, the detection of the ps-level pulse width cannot be realized.
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Embodiment 1
[0036] like Figure 1 to Figure 2 As shown, a glitch detection method at a high-speed sampling rate includes the following steps:
[0037] S1: collecting data to be identified;
[0038] S101: Obtain two sets of data to be detected by alternately sampling in time the data channels of the data to be identified by two acquisition units;
[0039] In this embodiment, a high-speed transceiver inside the FPGA is used as the acquisition unit. Among them, the GTY transceiver can convert high-speed serial signals into low-speed parallel signals to achieve a sampling rate of 25Gbps, and the data bit width is 128 bits at this time.
[0040] The acquisition unit includes a first acquisition unit and a second acquisition unit, the QUAD phase of the reference clock of the second acquisition unit is 180° greater than the QUAD phase of the reference clock of the first acquisition unit.
[0041] The QUAD phase of the reference clock of the first acquisition unit is 0°, and the QUAD phase of ...
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The invention discloses a burr detection method under a high sampling rate. The burr detection method comprises the following steps: S1, collecting to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, carrying out burr identification on the to-be-identified data to obtain burr positions of normal sampling data. The invention further discloses a burr detection system under the high-speed sampling rate for realizing the burr detection method under the high-speed sampling rate, the burr detection system comprises an acquisition unit and a burr identification unit, and the acquisition unit acquires data to be identified and processes the data to be identified to obtain normal sampling data; and the burr identification unit performs burr identification on the to-be-identified data to obtain a burr position of normal sampling data. According to the invention, accurate burr detection at a high sampling rate can be realized.
Description
technical field [0001] The invention relates to the field of data domain testing, in particular to a glitch detection method and system at a high-speed sampling rate. Background technique [0002] With the rapid development of semiconductor technology, the operating frequency of modern digital systems is getting higher and higher, and the setup / hold time of signals is getting shorter and shorter. The glitch on the signal may cause other units of the system to make wrong responses. Therefore, the need for accurate and fast glitch detection is becoming more and more urgent, which puts forward higher requirements for the field of data testing. [0003] In order to better test and analyze digital circuits, as a data domain test instrument, the glitch detection capability of logic analyzers urgently needs to be greatly improved. According to the definition of the glitch signal, it can be known that a pulse whose width is smaller than the current sampling interval is a glitch. T...
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IPC IPC(8): G01N21/88
CPCG01N21/88G01R31/31708G01R31/3177G01R31/31703G01R31/31725
Inventor 戴志坚杨万渝武建
Owner UESTC (SHENZHEN) ADVANCED RES INST