Special jig for flexibly and automatically adjusting thickness of test film

Abstract

The invention discloses a special jig for flexibly and automatically adjusting the thickness of a test film, which comprises a flexible adjusting bottom table, a probe cantilever mechanism, an industrial control computer, a compression air supply source and a light shield. The flexible adjusting bottom table comprises a mounting seat, a plurality of ejector pins, rubber balls, a plurality of groups of mounting air pipes and a plurality of electromagnetic air valves, and the mounting air pipes are in a plurality of groups and are uniformly and fixedly arranged on the mounting seat; the ejector pins are connected into the mounting air pipes in a dynamic sealing mode, the rubber balls are fixed to the top of the ejector pins and located on the outer side of the mounting air pipes, one end of each electromagnetic air valve is connected with the compressed air supply source, and the other end of each electromagnetic air valve is communicated with the corresponding mounting air pipe through an air inlet pipe; the plurality of electromagnetic air valves are in electric signal connection with the industrial control computer respectively to control on and off of the industrial control computer. The probe cantilever mechanism comprises a light path probe, a cantilever, a lifting rod and a servo motor, the cantilever is horizontally connected to the edge of the top of the lifting rod, the light path probe is fixed to one end of the cantilever, the servo motor is in electric signal connection with the industrial control computer, the mounting base is covered with the light shield in a matched mode, and an observation opening is formed in one side of the light shield.

Description

technical field [0001] The invention relates to a test fixture for measuring the thickness of a film surface by a spectroscopic method, in particular to a special fixture for flexible and automatic adjustment of the test film thickness. Background technique [0002] To measure anodic oxidation coating by spectroscopic method, it is necessary to ensure that the surface of the object to be tested is perpendicular to the optical path probe and there is a certain distance. At the same time, the test environment must be carried out in an environment free from interference from external light sources. Due to the variety of measured objects and various shapes, the measured object placed on the plane may not be perpendicular to the optical path probe due to the irregular shape of the measured object, and the distance is not fixed. [0003] At present, the test tooling used in the submicron-level anodized coating thickness measurement device is an aluminum alloy bench, the bottom tab...

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