Multifunctional measurement equipment, resource configuration method and device, measurement method and device, and medium

Abstract

An embodiment of the invention discloses multifunctional measurement equipment, a resource allocation method and device, a measurement method and device, and a medium. The multifunctional measurement equipment comprises a memory, a processor, a common circuit and a plurality of functional circuits, wherein the memory is used for storing a software program capable of realizing a measurement function; the common circuit is respectively connected with the plurality of functional circuits; the functions of the plurality of functional circuits are the same or partially the same or completely different; the processor is used for running the software program and performing resource configuration on a common circuit at least partially based on common resources required by the software program; and the processor is further used for controlling at least one functional circuit to work so as to realize a measurement function corresponding to the running software program. Various measuring functions can be realized at the same time, the space occupancy rate of the test bench or the test bench is saved, the test cost is reduced, and the waste of public resources is avoided.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of measuring instruments, and in particular, relate to a multifunctional measuring device, a resource configuration method, a measuring method, a device, and a medium. Background technique [0002] With the development of technology, there are more and more types of instruments. In the process of signal or system testing, the measurement results of multiple instruments are often used to obtain more accurate conclusions, such as: using an oscilloscope to test time-domain parameters, using a spectrum analyzer to test frequency-domain parameters, using signal sources to assist in testing system characteristics, etc. . In the actual test process, every time a test parameter is added, additional instruments need to be added for measurement. To complete a test, multiple instruments with different functions may be required at the same time. For test benches or test benches, multiple instrum...

AI Technical Summary

Problems solved by technology

For test benches or test benches, multiple instruments will cause stacking of instruments and space squeeze. For users who use instruments outdoors, carrying multiple instruments will cause great inconvenience, and the cost of purchasing multiple instruments at the same time is high

[0003] Although there are comprehensive measuring instruments at present, such instruments are often in the mode of "one main function + additional function", and the parameter indicators of each function are fixed, and users cannot adjust them by themselves

In addition, the same or similar hardware circuits will be used in instruments with different functions, which will cause a waste of public resources and increase the cost of instruments

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