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Spectral measurement device and method

A spectrum measurement and optical axis technology, applied in the field of spectrum analysis, can solve the problems of off-axis detection design, difficult processing and adjustment, etc., and achieve the effect of simple structure and improved accuracy

Pending Publication Date: 2021-12-24
SHENZHEN METALENX TECH CO LTD
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Problems solved by technology

[0005] In order to solve the existing technical problems, the embodiment of the present application provides a spectral measurement device to solve the problem of difficulty in the design, processing and assembly of off-axis detection in the related art. The technical solution provided by the embodiment of the present application is as follows :

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  • Spectral measurement device and method
  • Spectral measurement device and method

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Embodiment approach

[0105] Specifically, an optional implementation of the spectral measurement method provided in the embodiments of the present application is as follows:

[0106] The light to be detected enters the superlens dispersion system 1 in the form of parallel light after being parallelized, and the optical axis of the superlens dispersion system 1 is parallel to the optical path of the incident parallel light. Lights of different wavelengths in the incident parallel light are focused onto the optical axis of the metalens dispersion system 1 by the metalens dispersion system 1 , and different focal points are formed at different positions on the optical axis of the metalens dispersion system 1 . The distance from the focal point corresponding to light of different wavelengths to the back surface of the metalens dispersion system 1 is called the focal length, and the range formed by all the focal lengths is called the focal depth of the metalens dispersion system 1 . The focal length of...

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Abstract

The invention provides a spectral measurement device and method, and belongs to the field of spectral measurement. The device comprises a super-lens dispersion system, a microscopic system, a detector and a computer processing system; the optical axis of the super-lens dispersion system is parallel to incident light; the optical axis of the microscopic system is perpendicular to the optical axis of the super-lens dispersion system; the object space focus of the microscopic system is located on the optical axis of the super-lens dispersion system; the microscopic system, the detector and the computer processing system are sequentially connected, and the detector is located on an image space focal plane of the microscopic system. According to the spectral measurement device, the L-shaped super lens dispersion system and the microscopic system are utilized, the limitation of a large-angle dispersion system on the size of a detector is broken through, and the precision of a spectrograph is improved.

Description

technical field [0001] The present application relates to the technical field of spectroscopic analysis, in particular, to a spectroscopic measurement device and method. Background technique [0002] The spectral measurement device is a scientific instrument that decomposes complex light into spectral lines. It is composed of a prism or a diffraction grating. The spectral measurement device can measure the light reflected by the surface of an object. [0003] Spectrum measuring devices in the related art include grating-based spectroscopic measuring devices, narrow-band filter array-based spectroscopic measuring devices, and off-axis metasurface-based spectroscopic measuring devices. [0004] In the related art, grating-based spectral measurement devices and spectral measurement devices based on narrow-band filter arrays cannot be measured off-axis; while off-axis metasurface-based spectral measurement devices use metasurfaces to focus light of different wavelengths to diffe...

Claims

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Application Information

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IPC IPC(8): G01J3/28
CPCG01J3/28
Inventor 郝成龙谭凤泽朱健
Owner SHENZHEN METALENX TECH CO LTD
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