Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and assembly line for testing impedance of circuit board pins and characteristics of diodes

A diode characteristic and characteristic testing technology, which is applied in diode testing, electronic circuit testing, measuring devices, etc., can solve the problems of difficulty in meeting the efficiency requirements of circuit board pin testing and the low efficiency of manual testing of circuit board pin diode characteristics. Achieve the effect of improving test efficiency and making adjustments simple and convenient

Active Publication Date: 2021-12-28
北京京瀚禹电子工程技术有限公司
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, as the complexity of the circuit board increases, the number of pins on the circuit board increases, and the efficiency of manual testing of the impedance and diode characteristics of the circuit board pins becomes lower and lower, making it difficult to meet the efficiency of circuit board pin testing. need

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and assembly line for testing impedance of circuit board pins and characteristics of diodes
  • Device and assembly line for testing impedance of circuit board pins and characteristics of diodes

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] In order to make the purpose, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of the present disclosure. Obviously, the described embodiments It is a part of the embodiments of the present disclosure, but not all of them. Based on the embodiments in the present disclosure, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present disclosure.

[0046] In addition, the term "and / or" in this article is only an association relationship describing associated objects, which means that there may be three relationships, for example, A and / or B, which may mean: A exists alone, A and B exist at the same time, There are three cases of B alone. In addition, the character " / " in this article ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a device and an assembly line for testing impedance of circuit board pins and characteristics of diodes, belongs to the technical field of circuit board testing, and is used for solving the problem of low efficiency of circuit board testing in related technologies. The device comprises a testing interface module used for being connected with a circuit board to be tested, a characteristic testing module used for testing impedance and diode characteristics of pins of the circuit board to be tested, a switch switching module used for controlling a characteristic testing loop between the characteristic testing module and the testing interface module, and a test management module which is connected with the characteristic testing module and the switch switching module, and is used for controlling the switch switching module and receiving test data of the characteristic testing module. The device for testing can automatically test the circuit board and is beneficial to improving the testing efficiency of the circuit board. The assembly line for testing comprises the device for testing and has the advantages of the device.

Description

technical field [0001] The present application relates to the technical field of circuit board testing, in particular to a testing device and assembly line for the impedance and diode characteristics of circuit board pins. Background technique [0002] The pin test is a common test item in the circuit board test, which can determine the effectiveness of the circuit board pins. The two main parameters of circuit board pin testing are impedance and diode characteristics. The specific principle of the impedance and diode characteristic test of the circuit board pins is as follows: determine the power supply pin and ground pin of the circuit board; for each non-power supply pin, it is necessary to test its forward resistance and reverse resistance to the power supply pin. Resistor, and its voltage drop characteristics to the power supply pin and the protection diode of the ground pin. That is, four tests are required for each non-power supply pin. [0003] In the related ar...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/26G01R27/02
CPCG01R31/2806G01R31/2632G01R27/02
Inventor 霍风祥李鹏飞雷喻王臣
Owner 北京京瀚禹电子工程技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products