Equipment for automatically identifying and removing heterochromatic impurities in particulate matters at high speed

Abstract

The invention discloses equipment for automatically identifying and removing heterochromatic impurities in particulate matters at high speed, which comprises a hopper, a material conveying device, line scanning cameras, particulate matters, a light source, a background plate, a heterochromatic impurity elimination device, a main material box, a flaw material box and a central processing unit. An outlet of the hopper is located over the material conveying device, and two sets of line scanning cameras are arranged below the material conveying device. The two sets of line scanning cameras are symmetrically arranged, a heterochromatic impurity removing device is arranged below the line scanning cameras, a main material box and a flaw material box are arranged below the heterochromatic impurity removing device, and the output ends of the line scanning cameras are connected with the input end of a central processing unit; The output end of the central processor is connected with the input end of the heterochromatic impurity removing device.

Description

technical field [0001] The invention relates to a device, in particular to a device for automatically identifying and removing heterochromatic impurities in particulate matter at high speed. Background technique [0002] As downstream manufacturers have higher and higher requirements on the quality of raw materials, for example, the chemical industry has more and more stringent requirements on the proportion of impurities and pollutants in raw materials. In the early stage, this index was manually inspected and counted, and manual detection is expensive. The time length, different people or the same person at different times have large deviations in the counting of impurities. Impurities below 200 microns are extremely easy to miss. Later, an area array camera was used for single-sided photo detection, which improved the recognition rate of small impurities below 200 microns. However, the area array camera is equipped with a single camera on the detection structure, and the ...

AI Technical Summary

Problems solved by technology

[0002] As downstream manufacturers have higher and higher requirements on the quality of raw materials, for example, the chemical industry has more and more stringent requirements on the proportion of impurities and pollutants in raw materials. In the early stage, this index was manually inspected and counted, and manual detection is expensive. Time, different people or the same person at different times have large deviations in the counting of impurities. Impurities below 200 microns are extremely easy to miss. Later, an area array camera was used for single-sided photo detection, which improved the recognition rate of small impurities below 200 microns. However, the area array camera is equipped with a single camera on the detection structure, and the impurities on the back of the particles will be missed.

And due to the current technical bottleneck area array camera camera frequency does not exceed 30hz, the detection speed is slow

Moreover, the continuous photos taken by the area array camera cannot ensure that there is no omission or no repeated shooting of the moving measured object, and the detection accuracy cannot be guaranteed.

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