Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Laser spot distribution and PIB factor measuring device and method based on orthogonal scanning

A technology of laser spot and measuring device, applied in measuring device, photometry, optical radiation measurement, etc., can solve the problems of high sampling frequency of detector, asymmetric sampling spatial resolution, limited number of sampling holes, etc. The effect of reliability

Active Publication Date: 2022-03-01
NORTHWEST INST OF NUCLEAR TECH
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem of the limited number of sampling holes and the high frequency of detector sampling in the existing scanning sampling method when measuring the laser PIB factor and the spatial distribution of light spots, especially when measuring the centimeter-scale PIB factor. , leading to serious asymmetry in sampling spatial resolution, and providing a laser spot distribution and PIB factor measurement device and method based on orthogonal scanning

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Laser spot distribution and PIB factor measuring device and method based on orthogonal scanning
  • Laser spot distribution and PIB factor measuring device and method based on orthogonal scanning
  • Laser spot distribution and PIB factor measuring device and method based on orthogonal scanning

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] In order to make the purpose, advantages and features of the present invention clearer, the laser spot distribution and PIB factor measurement device and method based on orthogonal scanning proposed by the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.

[0047] Such as Figure 1-4 As shown, the laser spot distribution and PIB factor measuring device based on orthogonal scanning of the present invention includes a measuring aperture 1, a detector 2, a first scanning disk 11 and a second scanning disk 11 arranged between the measuring aperture 1 and the detector 2 Two scanning discs 22 and a data acquisition system for recording and processing the output signal of the detec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a laser parameter measuring device and a laser parameter measuring method using the same, and aims to solve the problems that in an existing laser PIB factor measuring and light spot spatial distribution measuring method, especially when a centimeter-scale PIB factor is measured, due to the fact that the number of sampling holes is limited, and the sampling frequency of a detector is high, the sampling efficiency is high in an existing scanning and sampling method. And the resolution of the sampling space is seriously asymmetric. According to the orthogonal scanning-based laser spot distribution and PIB factor measurement device and method provided by the invention, the two groups of orthogonally arranged involute array sampling holes are adopted to synchronously scan the laser spots in a time-sharing manner, so that relatively uniform spatial resolution in two dimensions is obtained, and finally, the capture of the strongest power point of the spots is realized, and a relatively accurate PIB factor is obtained through measurement; and meanwhile, two scanning images can be merged into one image for fusion processing, so that high-resolution measurement of the light spots is realized.

Description

technical field [0001] The invention relates to a laser parameter measurement device and a laser parameter measurement method using the device, in particular to a laser spot distribution and PIB factor measurement device and measurement method based on orthogonal scanning. Background technique [0002] In the measurement of high power laser parameters, the beam quality is an important parameter, indicating the ability of the laser beam to emit to the far field. Common beam qualities include M2 ​​factor, β parameter, and power in bucket (PIB factor), among which the PIB factor represents the power concentration and focusability of the laser beam in the far field. [0003] In the measurement of the high-power laser far-field PIB factor, it is usually necessary to measure the power parameters in the laser barrel with a diameter of centimeters. The existing PIB measurement method is to use a diaphragm hole with a set diameter (such as 20 mm) to be set on the optical adjustment ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42G01J1/04
CPCG01J1/4257G01J1/0403
Inventor 陈绍武杨鹏翎栾昆鹏王振宝陶波王大辉薛天旸崔萌
Owner NORTHWEST INST OF NUCLEAR TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products