The invention discloses a preparation process for a tunneling scanning 
microscope probe with reverse exponent and depth-to-length-
diameter ratio. The process comprises the following steps: taking 
tungsten wire as the material for manufacturing the probe, immersing the 
tungsten wire into alkaline electrolytic solution to be taken as 
anode, winding a 
corrosion-resistance 
platinum wire on the periphery of the 
tungsten wire to be taken as 
cathode, sequentially adopting pulse width 
voltage signals with adjustable current and duty ratio to determine the immersing depth, the electrolytic 
voltage, solution concentration and the like of the tungsten wire, detecting the electrolytic current in real time, and automatically 
shunting down the 
voltage signals, thus stopping the 
electrolysis process when the slope of curve of the electrolytic current is larger than 0.8mA / ms. The process can be utilized for manufacturing tunneling scanning 
microscope probe with a reverse-exponent outline, wherein the 
radius of the probe tip is smaller than 20nm, and the length-to-
diameter ratio is higher than 100-1, so that a tunneling scanning 
microscope has the capability of achieving the atomic-scale 
image resolution ratio, and measuring the depth-to-
width ratio micro-nano structure.