Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

323 results about "Signal edge" patented technology

In electronics, a signal edge is a transition of a digital signal from low to high (0 to 1) or from high to low (1 to 0)...

Cross-correlation timing calibration for wafer-level IC tester interconnect systems

A timing calibration system for a wafer level integrated circuit (IC) tester is disclosed. The tester includes a set of probes for contacting pads on a surface of an IC and having a plurality of tester channels. Each channel generates a TEST signal at a tip of a corresponding probe in response to a periodic CLOCK signal with a delay adjusted by drive calibration data supplied as input to the tester channel. The TEST signal produced by each channel includes edges occurring in a timing pattern controlled by programming data provided as input to each tester channel. To calibrate test signal timing of all channels, each channel is programmed to generate a test signal having the same repetitive edge timing pattern at the tester channel's corresponding probe tip. The test signal produced at each probe tip is then cross-correlated to a periodic reference signal having the same repetitive edge timing pattern. The drive calibration data of each channel is then iteratively adjusted to determine a value which maximizes the cross-correlation between its output test signal and the reference signal. To maximize the accuracy of the timing calibration, each repetition of the test and reference signal edge pattern provides pseudo-randomly distributed time intervals between successive signal edges.
Owner:FORMFACTOR INC

Apparatus for measuring intervals between signal edges

An apparatus for measuring a time interval between a start signal edge and a stop signal edge provides a stable clock signal as input to a delay line formed by a series of similar logic gates. The output signal of the last gate of the series is phase locked to the clock signal by adjusting a bias signal controlling the switching speed of all gates. The clock signal and the output signal of each gate form a set of phase distributed periodic timing signals applied to a start time measurement unit (TMU) and a similar stop TMU. The start TMU counts edges of one of the timing signals occurring between an edge of an arming signal and the start signal edge and generates output data representing a time delay between the arming signal and the start signal edge. The data represents the start delay as a whole and fractional number of clock signal periods by conveying the counter output and by indicating which of the timing signals had an edge most closely following the start signal edge. The stop TMU similarly produces output data indicating a whole an fractional number of clock cycles occurring between the arming signal and the stop signal edge. The delay represented by the start TMU output data is subtracted from the delay represented by the stop TMU output data to determine the interval between the start and stop signal edges.
Owner:CREDENCE SYSTEMS

System and method of obtaining random jitter estimates from measured signal data

InactiveUS20050286627A1Convenient to accommodateData-dependent jitter can be eliminated or significantly minimizedDigital circuit testingNoise figure or signal-to-noise ratio measurementData streamData signal
A method of estimating random jitter from measured samples of a transmitted data signal includes a first step of obtaining a plurality of measurements (e.g., pulse widths) for a plurality of selected signal edges within a transmitted data stream, where the data stream comprises a repeating data pattern having a known bit length and known number of rising edges, and wherein the time difference between adjacent measurements is determined by an event count increment equal to an integer multiple of the known number of rising edges. A time interval error value is then computed for each measured signal edge. Time interval error values are then transformed into corresponding TIE frequency components (via, for example, an FFT) for selected of the measured signal edges, wherein the TIE frequency components are representative of both noise floor as well as multiple distinct frequency peaks. Noise floor is separated from the multiple distinct frequency peaks representative of periodic jitter by replacing each TIE frequency component greater than a predetermined value with a lower predetermined replacement value. The power of the noise floor may be computed to provide an estimate of random jitter variance, from which the standard deviation may be calculated.
Owner:GUIDE TECH

Edge accelerated sense amplifier flip-flop with high fanout drive capability

ActiveUS6924683B1High fanout drive capabilityFast timeElectric pulse generatorLeading edgeAudio power amplifier
Flip-flop devices provide fast clock-to-Q timing that exploits the pulsed nature of outputs generated by a clocked sense amplifier. These flip-flop devices include an output stage, which has a PMOS pull-up transistor and an NMOS pull-down transistor therein, and a clocked sense amplifier at an input stage. The clocked sense amplifier is configured to generate first and second data output signals (/SET and /RESET). These data output signals are provided to a signal edge acceleration stage. This signal edge acceleration stage is configured to generate the pull-up and pull-down control pulses in response to the first and second data output signals, respectively. This leading edge acceleration stage includes a pull-up buffer having an odd (even) number of inverters therein that are skewed to accelerate the leading edge of the pull-up control pulse relative to a trailing edge of the pull-up control pulse. The leading edge acceleration stage also includes a pull-down buffer having an even (odd) number of inverters therein that are skewed to accelerate the leading edge of the pull-down control pulse relative to a trailing edge of the pull-down control pulse. Accordingly, the pull-up buffer accelerates the clock-to-Q timing when driving Q high and the pull-down buffer accelerates the clock-to-Q timing when driving Q low.
Owner:INTEGRATED DEVICE TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products