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Waveguide port test fixture capable of realizing calibration and de-embedding technology

A test fixture and port test technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve cost-saving effects

Pending Publication Date: 2022-03-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the test equipment is calibrated before testing the DUT whose port is a waveguide, ignoring the influence of the fixture on the DUT. Such test results not only have the results of the DUT, but also have the influence of the fixture.
At the same time, the position of the waveguide port of this kind of fixture is fixed, and the test fixture with different port positions needs to be customized

Method used

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  • Waveguide port test fixture capable of realizing calibration and de-embedding technology
  • Waveguide port test fixture capable of realizing calibration and de-embedding technology
  • Waveguide port test fixture capable of realizing calibration and de-embedding technology

Examples

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Embodiment 1

[0032] Example 1: Calibration and testing

[0033] In this embodiment, a calibration scheme for a waveguide port test fixture is provided, and the calibrated fixture is used for testing, image 3 A schematic diagram of calibration for an embodiment of the present invention, Figure 4 is a schematic diagram of the channel calibration performed in the calibration step, Figure 5 It is a schematic diagram of testing the DUT with the calibrated waveguide fixture, Image 6 Customized legends for 4 types of DUTs.

[0034] The equipment used in this embodiment includes: a group of waveguide port test fixtures, a vector network analyzer, a group of coaxial waveguide converters, two cables, a group of standard waveguide calibration parts, a two-port DUT (need custom made). The connection between devices is as image 3 As shown, firstly connect the two coaxial waveguide converters to the flanges on the sides of the two test fixtures respectively, locate and fix them with the pins a...

Embodiment 2

[0043] Example 2: De-embedding

[0044] In this embodiment, a de-embedding solution for a waveguide port test fixture is provided, Figure 4 It is a schematic diagram of the de-embedding performed by the embodiment of the present invention.

[0045] The equipment used in this embodiment includes: a group of waveguide port test fixtures, a vector network analyzer, a group of coaxial waveguide converters, two cables, a group of standard waveguide calibration parts, a two-port DUT (need custom made). The two test fixtures in this embodiment need to be used symmetrically, and the connection method between the devices is as follows Figure 4 As shown, first connect the coaxial waveguide converter and Yanet with a coaxial cable, then calibrate the coaxial waveguide converter, and move the test end face to the waveguide end face of the coaxial waveguide converter.

[0046] After the calibration is completed, connect the waveguide fixture with the coaxial waveguide converter and st...

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Abstract

The invention discloses a waveguide port test fixture capable of realizing calibration and de-embedding technology, which comprises a first test fixture and a second test fixture which have the same structure, and flange plates are respectively arranged on the upper surfaces and one side surfaces of the first test fixture and the second test fixture. The flange plates on the upper surface and the side surface of each test fixture are connected through L-shaped waveguides in the test fixtures; and the flange plates of the first test fixture and the second test fixture are used for connecting a vector network analyzer or a tested piece. Calibration and de-embedding are applied to the waveguide port test clamp, the test end face is moved to the end face of the tested piece through a calibration method, or the influence of the clamp is removed through a de-embedding method, and the real test result of the tested piece can be obtained. Meanwhile, the waveguide port test fixture is divided into two parts, and the same group of fixtures can be applied to waveguide port tested pieces at different positions in the same plane.

Description

technical field [0001] The invention relates to a waveguide port test fixture, in particular to a waveguide port test fixture capable of realizing calibration and de-embedding techniques, and at the same time, the fixture is suitable for a dual-port device under test (DUT) with multiple waveguide ports at different positions on the same horizontal plane . Background technique [0002] Waveguide port test fixture. When measuring a dual-port device under test (DUT) with waveguide ports on the same plane, a waveguide port test fixture is required to place the DUT, and connect the DUT to the test equipment through this fixture. [0003] The test equipment needs to be calibrated before testing. There are many calibration methods such as SOLT, SOLR, TRL, etc. Calibration through standard calibration parts can move the test end surface from the vector grid to the calibration end surface. The de-embedding technique is to measure the DUT on the basis of known S-parameters of the tes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/02G01R31/00
CPCG01R1/02G01R31/00
Inventor 胡江傅香渝周扬帆刘林杰乔志壮郭丰强侯耀伟
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA