Electrostatic force applying method and system considering deformation of electrode surface and thin film reflecting surface

Abstract

The invention belongs to the technical field of radar antenna simulation, and discloses an electrostatic force applying method and system considering deformation of an electrode surface and a thin film reflector, and the method comprises the steps: building an electrostatic forming thin film reflector antenna finite element model, and applying boundary constraint; sequentially calculating coordinates of projection points of the midpoints of the thin film reflecting surface units projected to the electrode surfaces, calculating distances between the midpoints of the thin film units and the projection points, and calculating electrostatic force by using a plate capacitance formula; applying the electrostatic force to the electrode surface and the thin film reflecting surface for finite element structure deformation analysis, and recalculating the electrostatic force according to the node positions of the deformed electrode surface and the thin film reflecting surface by using the above steps to continue the finite element structure deformation analysis of the electrostatic forming thin film reflecting surface antenna until the deformation analysis precision requirement is met. According to the method, the electrostatic force can be accurately calculated when the electrode surface and the thin film reflecting surface deform, and a theoretical basis is provided for deformation analysis and forming control of a high-precision electrostatic forming thin film reflecting surface antenna.

Description

technical field [0001] The invention belongs to the technical field of radar antenna simulation, and in particular relates to an electrostatic force applying method and system considering the deformation of an electrode surface and a film reflection surface. Background technique [0002] At present, the electrostatically formed thin-film reflector antenna generally consists of a cable-membrane electrode surface and a thin-film reflector, and a capacitor with a certain distance is formed between them. When different voltages are applied to the electrode surface and the reflective surface of the film, an electrostatic adsorption force will be generated between the two. Since both the cable-membrane electrode surface and the film reflective surface are flexible structures, the electrode surface and the film reflective surface will be deformed under the action of electrostatic force, and the deformation of the electrode surface and the film reflective surface will change the dis...

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Problems solved by technology

[0010] Aiming at the problems existing in the prior art, the present invention provides an electrostatic force application method and system considering the deformation of the electrode surface and the film reflective surface, especially relates to an electrostatic force application and electrostatic forming film considering the deformation of the electrode surface and the film reflective surface A high-precision deformation analysis method for reflector antennas, aiming to solve the problem of electrostatic force calculation when the electrode surface and the film reflector are deformed at the same time

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