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Multi-parallel-line laser object three-dimensional contour measuring device and measuring method

A technology of three-dimensional profile and measuring device, which is applied in the field of optical measurement, can solve the problems of low precision, complex calibration process of multi-line laser measurement technology, and low measurement efficiency, and achieve the effects of high measurement accuracy, convenient calculation, and improved measurement efficiency

Pending Publication Date: 2022-03-29
浙江四点灵机器人股份有限公司
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Problems solved by technology

[0004] In order to solve the shortcomings of the existing line laser measurement technology, such as low measurement efficiency, complicated calibration process and low precision of multi-line laser measurement technology, the present invention provides a multi- Parallel line laser object three-dimensional profile measuring device and measuring method

Method used

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  • Multi-parallel-line laser object three-dimensional contour measuring device and measuring method
  • Multi-parallel-line laser object three-dimensional contour measuring device and measuring method
  • Multi-parallel-line laser object three-dimensional contour measuring device and measuring method

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Effect test

Embodiment 1

[0068] Embodiment 1: The multi-parallel line laser 1 emits multiple parallel laser lines, and the emitted multiple laser lines are parallel and equally spaced. In particular, the multi-parallel line laser 1 can be a combination of multiple first lasers, and the number of laser lines is 30 , get the relevant parameters of the system, that is, the reflection angle and incidence angle and the height difference of the object 9 at the position of two adjacent laser lines, and bring it into the formula w>hcosθ 1 (tanθ 1 +tanθ 2 ), wherein the height difference of the object 9 can be taken as the overall height difference of the object 9, and the interval between the laser lines is 20mm in the experiment, which satisfies the condition of the formula. The laser line is irradiated on the detection platform 3 at an incident angle of 38°.

[0069] The camera 12 and the detection platform 13 form a certain angle to receive the diffuse reflection light of all laser lines. Specifically, ...

Embodiment 2

[0078] Embodiment 2: In some scenarios, it is necessary to efficiently measure the general shape of the object 9, or the object 9 is relatively flat. After the object 9 is placed on the detection platform 13, the camera 12 only needs to take one image to restore the object 9 dimensional silhouettes.

[0079] Special, in the specific embodiment, keep other parameters of the system unchanged, select 120 laser lines, and the interval between laser lines is 5mm. After verification, the interval satisfies the formula w>hcosθ 1 (tanθ 1 +tanθ 2 )conditions of. After the object 9 is placed on the detection platform, the camera shoots once to obtain the offset of the 9120 contour lines of the object at this position relative to the reference position, and obtain the height information at these positions. When using the sample recovery function

[0080]

[0081] Obtain the surface profile of object 9.

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Abstract

The invention discloses a multi-parallel-line laser object three-dimensional contour measuring device and method, and the device comprises a detection platform, an imaging collection device, an imaging collection device lens, a multi-parallel-line laser, a processor, and the like, and the measuring method comprises the steps: enabling the multi-parallel-line laser to emit a plurality of laser lines with parallel light surfaces at the same time; and placing the measured object in the field of view of the imaging device, and ensuring that the reflected light of all the parallel laser rays is imaged on the surface of the imaging acquisition device through a lens of the imaging acquisition device. According to the invention, the height information corresponding to each object contour line can be directly calculated according to the imaging offset of each level of laser rays, the measurement efficiency is greatly improved, the calibration process of the system is simple, and the height measurement precision is high. Parameters of the system can be properly adjusted to adapt to the overall size of a to-be-measured object, and the application range is wide.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to a multi-parallel line laser object three-dimensional profile measurement device and measurement method. Background technique [0002] Three-dimensional optical profilometry has the characteristics of non-contact, fast speed and high precision, and has been widely used in medical diagnosis, automatic navigation, 3D reconstruction, vehicle assembly and other fields. In industrial application scenarios, it is mostly necessary to find the defect location of the object by matching the three-dimensional contour information of the object with the standard model. Therefore, three-dimensional measurement technology is of great significance to speed up industrial manufacturing, and fast and precise three-dimensional measurement technology is becoming more and more important. [0003] The laser light source has the advantages of high intensity and good directionality, and is wi...

Claims

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Application Information

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IPC IPC(8): G01B11/25
CPCG01B11/25
Inventor 林斌王尧
Owner 浙江四点灵机器人股份有限公司
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