Testing device

A test device and test bench technology, applied in the direction of the measuring device shell, etc., can solve the problems of difficult control of manipulator precision, poor test data consistency, and affect test quality, so as to reduce test inaccuracy, improve test quality, and ensure movement accuracy. Effect

Active Publication Date: 2022-03-29
GOERTEK INC
View PDF14 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the mainstream solution is that the manipulator drives the test piece to move towards the circuit board to be tested. However, the accuracy of the stroke of the manipulator is difficult to control, and it is prone to problems such as poor contact of the test piece and poor test data consistency during the test; or the test The product under test caused by overvoltage caused the problem of high defect rate, which affected the test quality

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing device
  • Testing device
  • Testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0051] It should be noted that all directional indications (such as up, down, left, right, front, back...) in the embodiments of the present invention are only used to explain the relationship between the components in a certain posture (as shown in the accompanying drawings). Relative positional relationship, movement conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0052] In the present in...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a testing device. The testing device comprises a testing table, a testing mechanism, a moving mechanism and a limiting piece. The test board is used for fixing a circuit board to be tested; the testing mechanism is arranged on one side of the testing table, the testing mechanism comprises at least one pair of detection assemblies, and the detection assemblies are electrically connected with a tester; the moving mechanism is connected with the testing mechanism and drives the testing mechanism to move towards or away from the testing table so that the detection assembly can elastically abut against the circuit board to be tested. The limiting piece is connected with the testing mechanism, and when the testing mechanism moves towards the testing table, the limiting piece abuts against the testing table so as to limit the moving distance of the testing mechanism relative to the testing table. According to the technical scheme, the testing quality of the testing device is improved.

Description

technical field [0001] The invention relates to the technical field of testing equipment, in particular to a testing device. Background technique [0002] A circuit board is an important part of an electronic product, and multiple electronic components are integrated and connected on the circuit board to realize various functions of the electronic product. In order to ensure the yield rate of electronic products, after the electronic components are connected to the circuit board assembly, the electronic circuit of each electronic component is usually tested, and this test needs to be completed on a test device. [0003] The test device includes a test bench and a movable test piece. The circuit board to be tested is fixed on the test bench, and the test piece moves toward the circuit board and abuts against the contact points of each electronic component on the test circuit board to realize electronic testing. Electronic circuits of components are tested. At present, the m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04
CPCG01R1/04
Inventor 王新江李丰国李建坤汤洪恩尹春雷
Owner GOERTEK INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products