Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Common-aperture medium-long wave infrared imaging optical system

A long-wave infrared, imaging optics technology, applied in the field of optics, can solve the problems of low light-gathering ability, low resolution, difficulty in designing and developing optical systems, etc., and achieve the effect of strong light-gathering ability and excellent imaging quality

Active Publication Date: 2022-03-29
JIHUA LAB
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The use of medium-wave infrared and long-wave infrared for detection is a commonly used detection method. However, in the traditional scheme, a single optical lens is basically used to achieve single-spectrum imaging. With the development of technology, infrared dual-color detectors can Simultaneously output mid-wave infrared and long-wave infrared images, thus reducing the complexity of the optical system, but this also brings great difficulty to the design and development of the optical system, because it means that the optical system needs to integrate mid-wave infrared and long-wave infrared The ultra-broadband information is collected on the target surface of the detector. Therefore, the current dual-wave detection optical system has problems such as low light-gathering ability, low resolution, and unsatisfactory imaging effects.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Common-aperture medium-long wave infrared imaging optical system
  • Common-aperture medium-long wave infrared imaging optical system
  • Common-aperture medium-long wave infrared imaging optical system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0056] The technical solutions in this application will be clearly and completely described below in conjunction with the drawings in this application. Obviously, the described embodiments are only some of the embodiments of this application, not all of them. The components of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of the present application.

[0057] It should be noted that like numerals and letters denote similar items in the following figures, theref...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a common-aperture medium-long wave infrared imaging optical system, and relates to the technical field of optics, and the main points of the technical scheme are that the common-aperture medium-long wave infrared imaging optical system comprises a first lens, a second lens, a third lens, a fourth lens and a fifth lens which are sequentially arranged from an object side to an image side along an optical axis, the second lens has negative focal power; the third lens has positive focal power; the fourth lens has negative focal power; the focal power of the first lens is phi 1, the focal power of the whole optical system is phi, and phi 1 / phi is larger than or equal to 0.4 and smaller than or equal to 0.75. The focal power of the second lens is phi 2, and phi 2 / phi is more than or equal to-0.65 and less than or equal to-0.35; the combined focal power of the third lens and the fourth lens is phi 34, and phi 34 / phi is larger than or equal to 1.05 and smaller than or equal to 1.25. The common-aperture medium-long wave infrared imaging optical system provided by the invention has the advantages that the complete common-path design of medium-wave infrared and long-wave infrared is realized, the spatial size of the optical system is reduced, and the optical system has large-relative-aperture imaging capability, high light gathering capability and excellent imaging quality.

Description

technical field [0001] The present application relates to the field of optical technology, and in particular, to a common-aperture mid- and long-wave infrared imaging optical system. Background technique [0002] The use of mid-wave infrared and long-wave infrared detection is a commonly used detection method. However, in the traditional scheme, a single optical lens is basically used to achieve single-spectrum imaging. With the development of technology, infrared dual-color detectors can Simultaneously output mid-wave infrared and long-wave infrared images, thus reducing the complexity of the optical system, but this also brings great difficulty to the design and development of the optical system, because it means that the optical system needs to integrate mid-wave infrared and long-wave infrared The ultra-broadband information is collected on the target surface of the detector. Therefore, the current dual-wave detection optical system has problems such as low light gatheri...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G02B13/14G02B13/18
CPCG02B13/146G02B13/18
Inventor 伍雁雄乔健陈太喜
Owner JIHUA LAB
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products