Chip testing method and system
A chip testing and chip technology, applied in the field of chip testing methods and systems, can solve the problems of inability to meet high-efficiency testing requirements and low HDMI chip testing efficiency, and achieve the effects of high testing efficiency, low testing difficulty, and high testing accuracy.
Pending Publication Date: 2022-04-12
LONTIUM SEMICON CORP
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Problems solved by technology
[0003] At present, the Field-Programmable Gate Array (FPGA) chip is used to test the HDMI chip, but the testing efficiency of the commonly used FPGA chip for the HDMI chip is low, which cannot meet the high-efficiency test requirements.
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[0040] In order to make the above purpose, features and advantages of the present application more obvious and understandable, the specific implementation manners of the present application will be described in detail below in conjunction with the accompanying drawings.
[0041] In the following description, a lot of specific details are set forth in order to fully understand the application, but the application can also be implemented in other ways different from those described here, and those skilled in the art can do it without violating the content of the application. By analogy, the present application is therefore not limited by the specific embodiments disclosed below.
[0042] Secondly, the present application is described in detail in combination with schematic diagrams. When describing the embodiments of the present application in detail, for the convenience of explanation, the cross-sectional view showing the device structure will not be partially enlarged according...
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The invention provides a chip test method and system, and the method and system are applied to a high-definition multimedia interface HDMI chip, the HDMI chip at least comprises M HDMI input interfaces and N HDMI output interfaces, at least one of M and N is greater than 1, the M HDMI input interfaces receive HDMI signal test data sent by M signal sources respectively, and the M HDMI input interfaces are used for receiving the HDMI signal test data sent by the M signal sources respectively. The N HDMI output interfaces respectively send received HDMI signal test data to the N receivers for data verification to obtain a verification result, the verification result can reflect whether data receiving and data sending of the HDMI chip are normal or not, signal sources with the same number as the HDMI chip input interfaces and the receivers with the same number as the HDMI chip output interfaces are adopted, and the signal sources with the same number as the HDMI chip input interfaces and the receivers with the same number as the HDMI chip output interfaces are adopted. Each input interface and each output interface of the HDMI chip are respectively tested, the test efficiency is relatively high, the cost is low, the test difficulty is relatively low, and the test accuracy is relatively high.
Description
technical field [0001] The invention relates to the field of semiconductors, in particular to a chip testing method and system. Background technique [0002] Currently, chips are tested before they are shipped out of the factory to reduce the probability of providing chips with poor performance to users. As an important audio and video data transmission interface chip, a chip based on a High Definition Multimedia Interface (HDMI) has been widely used in electronic devices. [0003] Currently, a field-programmable gate array (Field-Programmable Gate Array, FPGA) chip is used to test the HDMI chip, but the testing efficiency of the commonly used FPGA chip for the HDMI chip is low, which cannot meet the high-efficiency test requirement. Contents of the invention [0004] In view of this, the purpose of this application is to provide a chip testing method and system, which can meet the high-efficiency testing requirements of HDMI chips, and has low cost, low testing difficult...
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IPC IPC(8): G01R31/317
Inventor 薛学亮周大锋夏洪锋任殿升程子翔吕明
Owner LONTIUM SEMICON CORP