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Method and device for testing solid state disk, computer storage medium and terminal

A solid-state drive, test host technology, applied in static memory, instruments, etc., can solve the problem that the test efficiency cannot meet the test requirements of SSD, and achieve the effect of improving the test efficiency

Pending Publication Date: 2022-04-12
合肥大唐存储科技有限公司
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Problems solved by technology

[0004] With the increase of SSD application scenarios, SSDs are applied to different test platforms, and the performance test range of SSDs also needs to be increased. The current test efficiency for abnormal power failure of the whole machine cannot meet the test requirements of SSDs. How to improve the abnormal performance of SSDs? The test efficiency of machine power failure has become a technical problem to be solved

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  • Method and device for testing solid state disk, computer storage medium and terminal
  • Method and device for testing solid state disk, computer storage medium and terminal
  • Method and device for testing solid state disk, computer storage medium and terminal

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Embodiment Construction

[0028] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0029] The steps shown in the flowcharts of the figures may be performed in a computer system, such as a set of computer-executable instructions. Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0030] figure 1 A flow chart of a method for testing a solid-state hard disk according to an embodiment of the present invention, such as figure 1 shown, including:

[0031] Step 101, according to the test parameter of each solid-state hard disk (SSD) t...

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Abstract

The invention discloses a method and device for testing solid state disks (SSD), a computer storage medium and a terminal, and the method comprises the steps: respectively generating a test script for carrying out abnormal complete machine power failure on each SSD to be tested according to predetermined test parameters of each SSD to be tested; controlling a power distribution unit (PDU) through the generated test script to obtain test log information of the SSD to be tested when the whole machine is abnormally powered down; respectively generating test result information corresponding to each SSD to be tested according to the obtained test log information; wherein the PDU is connected with more than one test host, and the test host is loaded with more than one SSD to be tested; the test parameters comprise the type of the SSD to be tested and / or the type of an operating system (OS) of the test host. According to the embodiment of the invention, the to-be-tested SSD is connected through the PDU, and the test script is generated through the test parameters of the to-be-tested SSD, so that the abnormal complete machine power failure of a plurality of different SSDs is realized, and the test efficiency of the abnormal complete machine power failure of the SSD is improved.

Description

technical field [0001] This article involves but is not limited to data storage technology, especially a method, device, computer storage medium and terminal for testing solid-state drives. Background technique [0002] A solid-state drive (SSD) is composed of a control unit and a storage unit (FLASH chip, DRAM chip); data is stored in the form of charge in the storage unit, and there is enough time to process the read and write process when the SSD is safely powered off, but the actual use of the SSD During the process, there will be an abnormal power failure of the whole machine. The performance test of the SSD includes the performance test after the power failure of the abnormal whole machine. [0003] Related technologies When performing a performance test of an abnormal SSD power failure, a data disk loaded on the test host is tested each time, and the current data disk that undergoes an abnormal SSD power failure only contains the data installed under the Windows syst...

Claims

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Application Information

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IPC IPC(8): G11C29/56
Inventor 胡亚君蒋海涛杨雪婷
Owner 合肥大唐存储科技有限公司
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