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Capacitance calibration method for successive approximation type ADC (Analog to Digital Converter)

A technique of successive approximation and calibration method, which is applied in the direction of analog/digital conversion calibration/test, electrical components, code conversion, etc. It can solve the problems of capacitance mismatch, increase layout area, and huge area, so as to avoid capacitance mismatch. Effect

Pending Publication Date: 2022-04-26
BRITE SEMICON SHANGHAI CORP
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0003] In a SAR ADC, one of the important accuracy limitations is the capacitance mismatch
To solve the limitation of matching accuracy, one of the traditional solutions is to increase the size of the capacitor to physically obtain higher matching accuracy, but this will increase the layout area and reduce the speed of the ADC. The increased area of ​​this solution will increase with the resolution. The increase of exponential growth, when the resolution is greater than 12bit, the required area is huge
Another method is capacitance calibration. Traditional capacitance calibration requires an additional calibration capacitor array, which increases the layout area.

Method used

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  • Capacitance calibration method for successive approximation type ADC (Analog to Digital Converter)
  • Capacitance calibration method for successive approximation type ADC (Analog to Digital Converter)
  • Capacitance calibration method for successive approximation type ADC (Analog to Digital Converter)

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Embodiment Construction

[0055] The present invention will be further described below in conjunction with accompanying drawing.

[0056] see figure 1 , image 3 and Figure 4 , the capacitor calibration method of the successive approximation ADC of the present invention, the successive approximation ADC includes a switched capacitor module, a comparator and a SAR logic module connected in sequence.

[0057] The capacitor array in the switched capacitor module includes an array of capacitors to be calibrated in sequence and a binary capacitor array C3 that does not need to be calibrated; the array of capacitors to be calibrated includes a temperature code capacitor array C1 to be calibrated in sequence and a binary capacitor to be calibrated Array C2. Capacitance sequence C in temperature code capacitor array C1 tm to C t0 , the capacitor sequence C in the binary capacitor array C2 n to C k+1 , the capacitor sequence C in the binary capacitor array C3 k to C 0 ;Switch S tm -S t0 ; Among the...

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Abstract

The invention discloses a capacitance calibration method for a successive approximation type ADC (Analog to Digital Converter). The capacitance calibration method comprises the following steps: initializing differential mode digital weights and single-ended mode digital weights of all capacitors to be calibrated in a switched capacitor module according to digital weights of ideal capacitors; obtaining the actual digital weight of each capacitor to be calibrated in the differential mode in sequence, and assigning the digital weight corresponding to the differential mode; sequentially acquiring the actual digital weight of each capacitor to be calibrated in the single-ended mode, and assigning the actual digital weight to the corresponding single-ended mode digital weight; assigning each differential mode digital weight or each single-ended mode digital weight to each actual final digital weight according to the selected differential mode or single-ended mode; and adding the analog output signal of the successive approximation type ADC by bit by using each actual final digital weight to obtain a digital output signal. According to the invention, self-calibration of the capacitor can be realized, and an additional calibration capacitor array is not needed.

Description

technical field [0001] The invention relates to the field of analog-to-digital converters, in particular to a capacitance calibration method for a successive approximation (SAR) type ADC (analog-to-digital converter). Background technique [0002] figure 2 It is a schematic diagram of an existing successive approximation analog-to-digital converter (SAR ADC), which generally includes switched capacitors, comparators, and SAR logic. The switched capacitor block is used for sampling and converting the digital output of the comparator into an analog signal with analog weights. The comparator is used to judge the analog signal of the switched capacitor module into a digital signal. The SAR logic module is used to control the logic control of the successive approximation, and feeds back the result of the comparator to the switched capacitor module bit by bit, and outputs the quantization result of the ADC at the same time. When the resolution of the ADC is high, a calibration ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/1009
Inventor 林志伦岳庆华刘亚东庄志青
Owner BRITE SEMICON SHANGHAI CORP
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