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Method for testing radiation transient response of photoelectric image sensor

An image sensor and transient response technology, applied in image communication, television, electrical components, etc., can solve the problems of photoelectric image sensor radiation damage, photoelectric image sensor transient response test influence, etc., to avoid the influence of background noise , the effect of accurate measurement

Pending Publication Date: 2022-05-13
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

In addition, the photoelectric image sensor working in the radiation environment will be damaged by the cumulative radiation of particles or rays, resulting in radiation noise
The above noises will have a certain impact on the transient response test of the photoelectric image sensor

Method used

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  • Method for testing radiation transient response of photoelectric image sensor
  • Method for testing radiation transient response of photoelectric image sensor
  • Method for testing radiation transient response of photoelectric image sensor

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Embodiment Construction

[0029] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.

[0030] The present invention proposes a test method for the radiation transient response of a photoelectric image sensor. The photoelectric image sensor mainly includes a charge-coupled device (CCD) and a CMOS image sensor. The method realizes the experimental measurement of the radiation transient response of the photoelectric image sensor. The research on radiation transient response of photoelectric image sensor provides technical support.

[0031] The test method for the radiation transient response of the photoelectric image sensor provided by the present invention specifically includes the following steps:

[0032] Step ...

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Abstract

The invention provides a photoelectric image sensor radiation transient response test method, which solves the problem of photoelectric image sensor transient response typical characteristic and rule experimental test in different radiation environments, and realizes rapid and accurate test and analysis of transient response. And technical support is provided for radiation noise processing and radiation signal identification of the photoelectric image sensor in a radiation environment. In order to avoid the influence of background noise of a device, the method comprises the following steps of: acquiring multiple frames of dark field images to calculate a mean value when a test is carried out, and then adopting a method of subtracting the background noise in a data processing process. In order to avoid the influence of heating of a device on a result in a test process, when a transient response test is carried out, firstly, a test system is preheated and monitored, and the test is carried out after the temperature is stable. In order to avoid the influence of radiation noise on a test result, the photoelectric image sensor transient response test system is moved out of a radiation field at regular intervals, or the photoelectric image sensor is replaced.

Description

technical field [0001] The invention belongs to the field of radiation effect testing, and in particular relates to a testing method for the transient response of radiation of a photoelectric image sensor. Background technique [0002] Radiation transient response refers to the phenomenon that electron-hole pairs generated when radiation particles or rays pass through the sensitive area of ​​the device are collected by the device to produce bright spots or bright lines in the output image. Compared with the cumulative radiation damage, the radiation transient response is non-permanent damage, which occurs when the imaging detection system is in the radiation field environment, and can be recovered after leaving the radiation field, and the transient signal appears randomly in each frame of image. [0003] The radiation transient response of photoelectric image sensors is mainly divided into the following two aspects: photoelectric image sensors (such as charge-coupled device...

Claims

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Application Information

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IPC IPC(8): H04N17/00
CPCH04N17/002
Inventor 王祖军薛院院陈伟刘敏波姚志斌何宝平盛江坤马武英缑石龙
Owner NORTHWEST INST OF NUCLEAR TECH
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