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Display panel testing device and display panel testing system

A display panel and testing device technology, applied in measuring devices, printed circuit testing, electronic circuit testing, etc., can solve problems such as printed circuit boards are easy to burn out, and achieve the effect of protection

Pending Publication Date: 2022-05-27
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present application provides a display panel testing device and a display panel testing system to alleviate the technical problem that the printed circuit board is easy to burn out in the full contact lighting test of the existing display panel

Method used

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  • Display panel testing device and display panel testing system
  • Display panel testing device and display panel testing system
  • Display panel testing device and display panel testing system

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Embodiment Construction

[0027] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of this application.

[0028] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", " rear, left, right, vertical, horizontal, top, bottom, inside, outside, clockwise, counterclockwise, etc., or The positional relationship is based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the ...

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PUM

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Abstract

The invention provides a display panel testing device and a display panel testing system.The display panel testing device comprises a circuit board, a testing component, a connecting component and a one-way conduction component, the circuit board is used for providing a testing signal, and the testing component comprises a plurality of testing probes which are mutually independent; the test probes are used for being attached to mutually independent connecting terminals on a display panel to be tested one by one so that test signals can be input to the display panel to be tested, the connecting component comprises a plurality of mutually independent test lines, the input ends of the test lines are connected with the circuit board, the output ends of the test lines are connected with the corresponding test probes, and the test probes are connected with the circuit board. The one-way conduction component is arranged on at least one test line and used for conducting a signal flowing from the input end of the corresponding test line to the output end and preventing the signal flowing from the output end of the corresponding test line to the input end. According to the invention, the reverse large current generated by the short circuit of the foreign matter can be prevented from entering the circuit board by the one-way conduction component, so that the protection of the circuit board is realized.

Description

technical field [0001] The present application relates to the field of display technology, and in particular, to a display panel testing device and a display panel testing system. Background technique [0002] After the display panel modularization process is completed, it is often necessary to use the full contact (full contact) lighting method to inspect the panel. ) is bound to the test member, and then the test member is used to fit the connection terminals on the panel. The test member includes a plurality of probes, and each probe is attached to each connection terminal respectively. The lighting signal of the PCB passes through multiple tests in the COF. The line reaches the probe and enters the panel through the connecting terminal for testing, so as to detect the abnormality of the panel in advance and scrap it, reducing the loss of module materials. However, due to the small distance between the connection terminals on the panel, if foreign objects appear between ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2806G01R31/2808
Inventor 不公告发明人
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD