Unlock instant, AI-driven research and patent intelligence for your innovation.

Array test sub-circuit, test circuit, test method and display panel

A technology of array testing and sub-circuits, applied in static indicators, instruments, etc., can solve the problems of typesetting difficulties, adverse effects of display panel display effects, and many test leads.

Pending Publication Date: 2022-06-03
YUNGU GUAN TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Once a short circuit occurs between the data lines, it will adversely affect the display effect of the display panel, resulting in a loss of yield of the display panel
Therefore, before the display panel leaves the factory, it is necessary to use the array test sub-circuit to test whether the data lines are short-circuited. However, the current array test sub-circuit has many test leads, and there are problems of insufficient space and difficult layout.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array test sub-circuit, test circuit, test method and display panel
  • Array test sub-circuit, test circuit, test method and display panel
  • Array test sub-circuit, test circuit, test method and display panel

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the various embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can appreciate that, in the various embodiments of the present invention, many technical details are set forth in order for the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in the present application can be realized.

[0024] like figure 1 As shown, there is an existing array test sub-circuit for short-circuit testing data lines of a display panel. The array test sub-circuit includes: four array test control signal lines, which are AT_mux1 , AT_mux2 , AT_mux3 and AT_mux4 respectively. The array test sub-circuit adopts the cy...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention relates to the technical field of display panel testing, and discloses an array test sub-circuit which can control signals of a plurality of data lines connected with a single test unit to be sequentially output from a test port through two test signal lines (a first test signal line and a second test signal line). Therefore, the short-circuit test of the data line in the display panel is realized. According to the array test sub-circuit, the test circuit, the test method and the display panel provided by the embodiment of the invention, the number of test leads in the array test sub-circuit is reduced, and the typesetting difficulty is reduced.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of display panel testing, and in particular, to an array testing subcircuit, a testing circuit, a testing method and a display panel. Background technique [0002] With the rapid development of display technology, the application of display panels is becoming more and more extensive. Among them, the requirements for the security of the display panel are getting higher and higher. [0003] The display panel includes a display area and a non-display area. A plurality of traces are centrally arranged in the non-display area, and the traces include data lines. In areas with dense traces, there is a high possibility of short circuits between adjacent data lines. Once a short circuit occurs between the data lines, the display effect of the display panel will be adversely affected, thereby causing a yield loss of the display panel. Therefore, before the display panel leaves the factory, it...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00G09G3/20
CPCG09G3/20G09G3/006
Inventor 白国晓安永军
Owner YUNGU GUAN TECH CO LTD