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Systems, devices, and methods for beam position monitoring and beam imaging

A beam and monitor technology that is used to facilitate non-invasive beam diagnostics, facilitate fast beam position monitoring to detect beam misalignment in beamlines, and solve problems such as contributions that are difficult to predict and explain

Pending Publication Date: 2022-06-07
TAE TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The contribution of these phenomena is difficult to predict and explain

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  • Systems, devices, and methods for beam position monitoring and beam imaging
  • Systems, devices, and methods for beam position monitoring and beam imaging
  • Systems, devices, and methods for beam position monitoring and beam imaging

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Embodiment Construction

[0037] Before the subject matter is described in detail, it is to be understood that this disclosure is not limited to the particular embodiments described, as such may, of course, vary. It is also to be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting, since the scope of the present disclosure will be limited only by the appended claims.

[0038] The term "particle" is used broadly herein and, unless otherwise limited, can be used to describe electrons, protons (or H+ ions), or neutrals, and having more than one electron, proton, and / or neutron (eg, other ions, atoms and molecules).

[0039] Example embodiments of systems, devices, and methods for diagnostics in beam systems (eg, including particle accelerators) are described herein. The embodiments described herein may be used with any type of particle accelerator, or in any particle accelerator application that involves generating a ...

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Abstract

Embodiments of systems, devices, and methods relate to fast beam position monitoring for detecting beam misalignment in a beam line. In an example, a fast beam position monitor includes a plurality of electrodes extending into an interior of an assembly of beam lines. The fast beam position monitor is configured to detect a position of the beam passing through the assembly of the beam line based on the beam halo current. Embodiments of the system, apparatus, and method are also directed to non-invasively monitoring a monitoring parameter of a light beam advancing along a light beam line. In an example, a gas is blown into a pumping chamber along a beam line. One or more beam parameters are measured from fluorescence caused by collisions of high-energy beam particles of a beam advancing through a beam line.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS [0002] This application claims US Provisional Application Serial No. 63 / 065,448, entitled "SYSTEMS, DEVICES, AND METHODS FORFAST BEAM POSITION MONITORING," filed August 13, 2020, and U.S. Provisional Application Serial No. 63 / 065,442, filed August 13, 2020, entitled "SYSTEMS, DEVICES, ANDMETHODS FOR GAS PUFF BEAM IMAGING," and U.S. Provisional Application Serial No. 62 / 894,290, filed August 30, 2019, entitled "SYSTEMS, DEVICES, ANDMETHODS FOR FAST BEAM POSITION MONITORING", and filed in 2019 Priority of U.S. Provisional Application Serial No. 62 / 894,220, filed August 30, 2010, entitled "SYSTEMS, DEVICES, AND METHODS FOR GAS PUFF BEAM IMAGING," It is hereby incorporated by reference in its entirety. technical field [0003] The subject matter described herein relates generally to beam systems, and in particular to beam diagnostics of charged particle beamlines of beam systems, and more particularly to systems for facilitating r...

Claims

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Application Information

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IPC IPC(8): A61N5/10A61N5/00H01J3/14H01J3/00
CPCA61N2005/109A61N5/1048H05H7/22H05H3/06H05H2277/113H05H2277/11G01R19/0061A61N5/1065A61N5/1067A61N5/1075G21K5/04G01T3/00
Inventor V·维克塞尔曼A·杜纳耶夫斯基
Owner TAE TECH INC
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