Systems, devices, and methods for beam position monitoring and beam imaging

A beam and monitor technology that is used to facilitate non-invasive beam diagnostics, facilitate fast beam position monitoring to detect beam misalignment in beamlines, and solve problems such as contributions that are difficult to predict and explain

Pending Publication Date: 2022-06-07
TAE TECH INC
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  • Systems, devices, and methods for beam position monitoring and beam imaging
  • Systems, devices, and methods for beam position monitoring and beam imaging
  • Systems, devices, and methods for beam position monitoring and beam imaging

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[0037] Before the subject matter is described in detail, it is to be understood that this disclosure is not limited to the particular embodiments described, as such may, of course, vary. It is also to be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting, since the scope of the present disclosure will be limited only by the appended claims.

[0038] The term "particle" is used broadly herein and, unless otherwise limited, can be used to describe electrons, protons (or H+ ions), or neutrals, and having more than one electron, proton, and / or neutron (eg, other ions, atoms and molecules).

[0039] Example embodiments of systems, devices, and methods for diagnostics in beam systems (eg, including particle accelerators) are described herein. The embodiments described herein may be used with any type of particle accelerator, or in any particle accelerator application that involves generating a ...

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Abstract

Embodiments of systems, devices, and methods relate to fast beam position monitoring for detecting beam misalignment in a beam line. In an example, a fast beam position monitor includes a plurality of electrodes extending into an interior of an assembly of beam lines. The fast beam position monitor is configured to detect a position of the beam passing through the assembly of the beam line based on the beam halo current. Embodiments of the system, apparatus, and method are also directed to non-invasively monitoring a monitoring parameter of a light beam advancing along a light beam line. In an example, a gas is blown into a pumping chamber along a beam line. One or more beam parameters are measured from fluorescence caused by collisions of high-energy beam particles of a beam advancing through a beam line.

Description

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Claims

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Application Information

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Owner TAE TECH INC
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