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A retractable chip probe and chip testing system

A chip testing and retractable technology, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of unfavorable chip miniaturization and a large number of probes, and achieve rich detection data, multiple detection data, and rich test functions Effect

Active Publication Date: 2022-08-02
STELIGHT INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the above-mentioned chip probes generally only have an electrical signal detection function, and other probes are needed for the temperature detection of the chip, which will cause too many necessary probes for the chip. In order to cater to the steps of the chip probe, the chip It needs to be bigger, which is not conducive to the miniaturization of the chip

Method used

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  • A retractable chip probe and chip testing system
  • A retractable chip probe and chip testing system
  • A retractable chip probe and chip testing system

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Embodiment Construction

[0036] figure 1 It is a cross-sectional view of a retractable chip probe 100 according to an embodiment of the present invention. like figure 1 As shown, in one embodiment, the telescopic chip probe 100 of the present invention includes a probe cover 10 , a first probe head 20 and an embedded optical fiber 30 . The probe cover 10 is typically a copper cover. The first probe head 20 is movable relative to the probe cover 10, for example, the first probe head 20 and the probe cover 10 are respectively connected by a spring 50, so that the first probe head 20 is relative to the probe when receiving pressure The sleeve 10 is moved so that the first probe head 20 is pressed against the probe contacts of the chip 300 with a suitable pressure. Of course it can also be figure 1 For the telescopic chip probe 100 with probe heads at both ends, it is only necessary to connect the two ends of the spring 50 to the first probe head 20 and the second probe head 40 respectively. The firs...

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Abstract

The invention provides a telescopic chip probe and a chip testing system, which belong to the technical field of chip testing. The retractable chip probe includes a probe cover and a first probe head that can move relative to the probe cover, the first probe head has a detection end exposed on the probe cover, and is used for detecting chips The electrical signal, wherein the first probe head is provided with a first through hole axially penetrating itself, the first through hole is fixed with an embedded optical fiber, and the embedded optical fiber has an axially opposite a first end and a second end, the first end is close to the detection end, the first end is recessed in the first through hole, and the second end is used for docking with the guiding fiber to transmit optical signals , the guiding fiber is connected to the optical signal analyzer. The present invention also provides a chip testing system including the above retractable chip probe. The telescopic chip probe and the chip testing system of the present invention are beneficial to the miniaturization of the chip.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a telescopic chip probe and a chip testing system. Background technique [0002] Generally, the electrical signal of the chip can be collected through the chip probe, and then the electrical signal can be received through the circuit board (PCB board), so as to analyze the state of the chip according to the collected electrical signal. Such chip probes are generally made of conductive materials and are specially used to collect and transmit electrical signals. [0003] The spring probe is a type of chip probe used for chip detection on a large pitch, that is, used for the detection of chips with a large distance between the detection contacts of the chips. The spring probe is generally equipped with a spring, one or both ends of the spring are provided with a probe head, the probe head is assembled with the copper sleeve, and the probe head can move relative to the copper s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067G01R31/28G01R35/00G01J5/00
CPCG01R1/06711G01R1/06722G01R31/2891G01R35/00G01J5/00
Inventor 罗跃浩黄建军胡海洋
Owner STELIGHT INSTR CO LTD
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