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Multifunctional measuring circuit suitable for Langmuir probe and control method thereof

A technology of Langmuir probe and measuring circuit, which is applied to the multifunctional measuring circuit of Langmuir probe and its control field, can solve the problems of low measurement efficiency, high maintenance cost and time, save maintenance cost and time, The effect of improving operational efficiency

Pending Publication Date: 2022-06-28
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

Due to the flexible application of Langmuir probes, it is often necessary to design different types of Langmuir probe systems according to different measurement requirements and equip them with corresponding measurement circuit systems, which leads to low measurement efficiency and high maintenance costs and time

Method used

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  • Multifunctional measuring circuit suitable for Langmuir probe and control method thereof
  • Multifunctional measuring circuit suitable for Langmuir probe and control method thereof
  • Multifunctional measuring circuit suitable for Langmuir probe and control method thereof

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Embodiment Construction

[0033] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0034] see figure 1shown is a schematic structural diagram of a preferred embodiment of a multifunctional measurement circuit suitable for a Langmuir probe provided by the present invention. The multifunctional measurement circuit suitable for Langmuir probes includes a first Langmuir probe 1, a second Langmuir probe 2, a first voltage sampling module, a second voltage sampling module, a current sampling module, A scanning power supp...

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Abstract

The invention discloses a multifunctional measuring circuit suitable for a Langmuir probe and a control method of the multifunctional measuring circuit. The circuit at least comprises the Langmuir probe, a plurality of relay switches and a control module. The output end of the first Langmuir probe is connected with the first end of the first voltage sampling module, the second end of the first voltage sampling module is connected with the first end of the second voltage sampling circuit, and the second end of the second voltage sampling circuit is connected with the output end of the second Langmuir probe; the first end of the first voltage sampling module is also connected with the first end of the current sampling module, and the second end of the current sampling module is connected with the scanning power supply or the voltage-stabilized power supply; and the control module is connected with each relay switch and is used for controlling the on-off of each relay switch, so that the circuit can be switched to different circuit modes. According to the invention, a corresponding circuit mode can be automatically switched according to the number of probes and measurement requirements, the operation efficiency of a measurement circuit system is effectively improved, and the maintenance cost and time are saved.

Description

technical field [0001] The invention relates to the technical field of magnetic confinement plasma diagnosis, in particular to a multifunctional measurement circuit suitable for a Langmuir probe and a control method thereof. Background technique [0002] Plasma is a state of matter that generally exhibits quasi-electrical neutrality and exists widely in the universe. Plasma has many important applications in science and technology, such as gas discharge, plasma etching, plasma coating and controlled fusion. The magnetic confinement plasma device uses a special form of magnetic field to confine electrically quasi-neutral plasma in a specific space. It is mainly used in the field of magnetic confinement fusion, including fusion devices such as tokamak and stellarator. Since plasmas are ubiquitous in nature and their key parameters, such as density and temperature, span a wide range, it is necessary to develop plasma diagnostic techniques to measure the key parameters of plasm...

Claims

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Application Information

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IPC IPC(8): G01R1/067G01R31/28
CPCG01R1/06711G01R31/282
Inventor 刘少承廖亮魏文崟高翔
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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