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Target measurement method and device, computer equipment and medium

A target measurement and target technology, applied in the field of measurement and testing, can solve the problems of low measurement efficiency and low measurement accuracy, and achieve the effect of improving measurement accuracy and measurement efficiency

Pending Publication Date: 2022-07-15
BEIJING BOE TECH DEV CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing measurement methods such as determining target size information based on target edge detection have problems such as low measurement efficiency and low measurement accuracy

Method used

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  • Target measurement method and device, computer equipment and medium
  • Target measurement method and device, computer equipment and medium
  • Target measurement method and device, computer equipment and medium

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Embodiment Construction

[0080] In order to illustrate the present invention more clearly, the present invention will be further described below with reference to the embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0081] In a scenario such as display panel testing, it is necessary to measure whether the dimensional information of the strip-shaped transparent sealant (OCA) used for bonding the film layer meets the requirements, such as the width of the applied sealant. The existing measurement methods, such as determining target size information based on target edge detection, have problems such as low measurement efficiency and low measurement accuracy.

[0082] At present, the rapid development of machine learning has enabled various machi...

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Abstract

The embodiment of the invention discloses a target measurement method and device, computer equipment and a medium. In one specific implementation mode, the target measurement method comprises the steps that binarization processing is carried out on a to-be-measured image containing a target to obtain a binarized image, the binarized image comprises a background area and a target area, and the target area extends to at least two image boundaries of the binarized image; and performing digital signal processing on the binarized image to obtain contour data of the target area, and determining size information of the target area according to the contour data and the binarized image.

Description

technical field [0001] The present invention relates to the technical field of measurement and testing. More specifically, it relates to a target measurement method, apparatus, computer equipment and medium. Background technique [0002] Currently, there is a need for target size measurement in many test scenarios. For example, in the scenario of display panel testing, it is necessary to measure whether the dimensional information of the strip-shaped transparent frame adhesive (Optically Clear Adhesive, OCA) used for bonding the film layer meets the requirements, such as the coating width. The existing measurement methods, such as determining target size information based on target edge detection, have problems such as low measurement efficiency and low measurement accuracy. SUMMARY OF THE INVENTION [0003] The purpose of the present invention is to provide a target measurement method and apparatus, computer equipment and medium to solve at least one of the problems exi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/60G06T7/13G06N3/04G06N3/08
CPCG06T7/60G06T7/13G06N3/08G06T2207/20081G06T2207/20084G06N3/045
Inventor 魏书琪哈谦姜博然冀潮欧歌钟楚千王友学侯孟军
Owner BEIJING BOE TECH DEV CO LTD