Chip testing equipment

Abstract

The embodiment of the invention discloses chip testing equipment, which comprises a rack, a testing area, a material preparing area, a sorting area, a feeding channel and a material returning channel are respectively formed on the rack, two ends of the feeding channel are respectively communicated with inlets of the material preparing area and the testing area, and two ends of the material returning channel are respectively communicated with outlets of the sorting area and the testing area; the feeding mechanism is configured to move in the feeding channel in a reciprocating manner so as to feed the to-be-tested chips in the material preparation area into the testing area; and the material taking mechanism is configured to move in the material returning channel in a reciprocating manner so as to send the tested chips which are tested in the testing area back to the sorting area. According to the scheme, the to-be-tested chip can be fed into the testing area without intermittence and waiting, the tested chip can be taken out and sent back to the sorting area, the whole feeding, testing and material taking process is compactly and smoothly connected, the problem of long time consumption caused by waiting for material taking is solved, and the working efficiency of the chip testing equipment is greatly improved to a certain extent.

Description

technical field [0001] The invention relates to the technical field of chip production, in particular to a chip testing device. Background technique [0002] As the control brain of electronic and electrical products, chips play an important role. With the continuous improvement of technology level and people's consumption level in recent years, the market demand for chips is increasing day by day. For chip manufacturers, in order to ensure the quality of chip manufacturing, it is generally necessary to regularly test and sort the chips before leaving the factory. [0003] In order to improve the efficiency of testing and sorting, chip testing equipment is generally used in the industry to complete related work. The existing chip testing equipment only has a single working channel, that is, during the testing process, the chip to be tested is sent to the testing machine through the intermediate turntable and the testing vehicle for testing, and then returns to the original ...

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention provides a chip testing device, which is used to solve the problems in the prior art that the waiting time is long, there are work intervals, and the working efficiency of the device is affected.

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