Parasitic capacitance extraction method and device based on Gaussian surface uniform sampling

A technology of parasitic capacitance and uniform sampling, which is applied in the direction of measuring devices, multi-channel program devices, measuring electrical variables, etc., can solve the problem of low extraction accuracy of parasitic capacitance, achieve uniform sampling, and improve the effect of extraction accuracy

Pending Publication Date: 2022-08-09
杭州行芯科技有限公司
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  • Application Information

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Problems solved by technology

[0007] This application provides a parasitic capacitance extraction method, device, electronic device and storage medium based on Gaussian surface uniform sampling to solve the problem of low accuracy of parasitic capacitance extraction caused by uneven distribution of sampling points on the Gaussian surface

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  • Parasitic capacitance extraction method and device based on Gaussian surface uniform sampling
  • Parasitic capacitance extraction method and device based on Gaussian surface uniform sampling
  • Parasitic capacitance extraction method and device based on Gaussian surface uniform sampling

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Embodiment Construction

[0026] In order to make the purpose, technical solution and advantages of this application more clear and clear, the following combined with the attachment and embodiments to describe and explain this application.

[0027] This embodiment provides a parasitic capacitor extraction method based on the Gaussian -based uniform sample, figure 1 It is a flowchart based on the parasitic capacitor extraction method based on the Gaussian surface of the application embodiment, such as figure 1 The method shows:

[0028] Step S101, the preset area of ​​the Gaussian surface corresponding to the target conductor is divided into the area of ​​the same area with an equal area.

[0029] In this embodiment, the CPU (central processor, Central Processing Unit) or other processors supporting multi -threaded parallel computing processors can be extracted for target conductors.

[0030] In this embodiment, you can first obtain the integrated circuit landscape where the target conductor is located, and...

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Abstract

The invention relates to a stray capacitance extraction method and device based on Gaussian surface uniform sampling, an electronic device and a storage medium. The method comprises the following steps: dividing a preset region of a Gaussian surface corresponding to a target conductor into a plurality of area elements with equal areas; distributing all area elements to a plurality of working threads; when the working thread carries out random walking, sampling is carried out on the area element corresponding to the working thread, and a sampling point on the area element corresponding to the working thread is obtained; and starting random walk from each sampling point, and calculating a parasitic capacitance value corresponding to the target conductor when all the working threads end random walk. Through the method and the device, the problem of low parasitic capacitance extraction precision caused by non-uniform distribution of sampling points on the Gaussian surface is solved, and the technical effects of uniform sampling on the Gaussian surface and further improvement of the parasitic capacitance extraction precision are achieved.

Description

Technical field [0001] This application involves the field of integrated circuit technology, especially a parasitic capacitor extraction method, device, electronic device and storage medium based on the Gaussian -based evenly sample. Background technique [0002] In the landscape verification of the integrated circuit, an important part is the extraction of parasitic capacitors of the conductor. As the industry's requirements for computing accuracy are getting higher and higher, the extraction of parasitic capacitors often depends on the three -dimensional field solution device for accurate solution. In the three -dimensional solution device, random walking algorithms are a more popular method. [0003] Random walking is different from conventional limited differences, finite elements and other methods. It does not require the linear equation group. The main steps include: the Gaussian surface of the constructed surround conductor, and the sampling point is selected from the Gaus...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/398G06F30/33G06F9/50G01R27/26
CPCG06F30/398G01R27/2605G06F30/33G06F9/5061G06F9/5027G06F2209/5018
Inventor 何裕焦吾振胡超曾宪强贺青
Owner 杭州行芯科技有限公司
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