Parasitic capacitance extraction method and device based on Gaussian surface uniform sampling
A technology of parasitic capacitance and uniform sampling, which is applied in the direction of measuring devices, multi-channel program devices, measuring electrical variables, etc., can solve the problem of low extraction accuracy of parasitic capacitance, achieve uniform sampling, and improve the effect of extraction accuracy
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[0026] In order to make the purpose, technical solution and advantages of this application more clear and clear, the following combined with the attachment and embodiments to describe and explain this application.
[0027] This embodiment provides a parasitic capacitor extraction method based on the Gaussian -based uniform sample, figure 1 It is a flowchart based on the parasitic capacitor extraction method based on the Gaussian surface of the application embodiment, such as figure 1 The method shows:
[0028] Step S101, the preset area of the Gaussian surface corresponding to the target conductor is divided into the area of the same area with an equal area.
[0029] In this embodiment, the CPU (central processor, Central Processing Unit) or other processors supporting multi -threaded parallel computing processors can be extracted for target conductors.
[0030] In this embodiment, you can first obtain the integrated circuit landscape where the target conductor is located, and...
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