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7results about How to "Uniform sampling" patented technology

Chip non-destructive testing system based on embedded current scanning

This invention relates to the field of chip inspection technology, and more particularly to a chip non-destructive testing system based on embedded current scanning. The system includes a current scanning module, an information acquisition module, a data analysis module, an abnormal scanning region generation module, and a scanning path generation module. Instead of simply performing a higher-density secondary scan of the entire chip, this invention intelligently filters out abnormal scanning regions requiring special attention based on the initial scan results and calculates their scanning priority. This allows valuable inspection time and computing resources to be concentrated on the most suspicious and severe areas, avoiding unnecessary repeated scanning in normal areas. The system dynamically selects the optimal scanning path based on the regularity of the region shape; for example, parallel lines are used for regular regions, and radial lines are used for irregular regions. This makes the scanning path more closely match the geometric features of the defect, obtaining a more complete region characterization with fewer scanning points, resulting in higher path planning efficiency.
Owner:TIANJIN RONGYING ELECTRONIC TECH CO LTD

Gas suction pipeline type combustible gas concentration detection device

The invention relates to the field of detection devices, in particular to a gas suction pipeline type combustible gas concentration detection device which comprises a gas suction sampling pipeline structure and a combustible gas detection unit. The combustible gas detection unit comprises an infrared detection cavity, a spherical optical fiber emission light source, an optical fiber and a detection circuit assembly; the inspiration sampling pipeline structure comprises a plurality of inspiration sampling pipelines, and the inspiration sampling pipelines are respectively communicated with different protection areas and are used for extracting sampling gas of the corresponding protection areas. The spherical optical fiber emission light source with the sapphire glass shell and the vacuum cavity is adopted, interference of the external environment on infrared rays emitted by the lamp filament is reduced, the multiple optical fibers are welded to the outer side of the shell, stable and efficient conduction of multiple paths of infrared rays can be achieved, infrared signal attenuation is reduced, the detection circuit assembly is combined with the Beer-Lanbert law, and the detection precision is improved. And the concentration is calculated by accurately measuring the characteristic frequency of the emitted infrared rays, so that the accuracy and consistency of the detection result are further improved.
Owner:NO 703 RES INST OF CHINA SHIPBUILDING IND CORP

Waste gas detection device capable of automatically collecting waste gas

ActiveCN224081600UImplement location sensinguniform samplingWithdrawing sample devicesControl engineeringData acquisition
The utility model relates to the technical field of instruments, discloses a waste gas detection device capable of automatically collecting waste gas, and solves the technical problem that multi-point (including special risk points) and multi-node data acquisition needs to be designed in the prior art. A gas acquisition module comprises a sampling pipe and a sampling pump, and the sampling pump is used for providing sampling power for the sampling pipe; the control module comprises a timing controller and a positioner, the positioner is used for transmitting the position information to the timing controller, and the timing controller realizes serial logic control on the sampling pump based on the clock chip and the positioning position information; the gas mixing tank body is used for temporarily storing sample gas collected from the sampling pipe; the sensor is arranged in the gas mixing tank body; the display unit is used for displaying detection result data. According to the technical scheme, multi-point (including special risk points) and multi-node data acquisition is achieved through control of the control module, position sensing is achieved through the positioner, and positioning can be achieved through a conventional position switch or a GPS wireless positioning chip.
Owner:HENAN HEZHONG TESTING CO LTD

Array type circular truncated cone type optical fiber probe underground multiphase flow gas holdup sensor

The invention relates to the technical field of optical fiber sensing, and discloses an array type circular truncated cone type optical fiber probe underground multiphase flow gas holdup sensor which comprises an array type optical fiber probe formed by a plurality of optical fiber probes, and the array type optical fiber probe is distributed in an underground measuring pipeline in a cross symmetry mode along the cross section of the pipeline; wherein each optical fiber probe is formed by grinding the tip part of the single-mode optical fiber, so that the tip part is of a circular truncated cone-shaped structure. Compared with an existing optical fiber sensor, the array type circular-truncated-cone-shaped optical fiber probe underground multiphase flow gas holdup sensor is higher in gas holdup measurement precision and lower in cost.
Owner:NORTHWEST UNIV

Multi-strategy unmanned aerial vehicle rapid obstacle avoidance path planning method and device based on dynamic ellipsoid sampling

ActiveCN121386800Buniform samplingHave uniformitySimulationUncrewed vehicle
The application discloses a multi-strategy unmanned aerial vehicle rapid obstacle avoidance path planning method based on dynamic ellipsoid sampling, which comprises the following steps: constructing an ellipsoid according to the starting point and the ending point of the unmanned aerial vehicle path planning, mapping a sampling point to the ellipsoid space to obtain a sampling point in the ellipsoid, and dynamically adjusting ellipsoid parameters through cyclic sampling to obtain an initial planning path and path nodes, which can focus on an effective area and improve sampling efficiency; a multi-strategy expansion mechanism is used to optimize the initial planning path nodes, and the convergence speed and obstacle avoidance ability are improved; potential parent nodes meeting the feasibility condition are searched in the neighborhood of the optimized path nodes, and the node with the minimum path cost is selected as a new parent node, and the new parent node is used to update the optimized planning path; a three-stage path smoothing strategy is used to smooth the updated optimized planning path, and an unmanned aerial vehicle planning path is obtained, so that the path feasibility and safety are ensured, and the path smoothness is improved.
Owner:HUAZHONG NORMAL UNIV

Wave field imaging method and device, electronic equipment and readable storage medium

The invention discloses a wave field imaging method and device, electronic equipment and a readable storage medium, and belongs to the technical field of geological exploration. The method comprises the following steps: acquiring ground seismic data and vertical seismic profile data; correcting the reference surface parameter of the ground seismic data and the reference surface parameter of the vertical seismic section data to obtain a target reference surface parameter; acquiring first coordinate data of a plurality of target detection points and second coordinate data of a plurality of target seismic sources based on the target reference plane parameters; and determining target wave field imaging of the geological section according to the multiple pieces of first coordinate data, the multiple pieces of second coordinate data, the ground seismic data and the vertical seismic section data. The target wave field imaging has the characteristics of uniform imaging, large imaging range and high resolution, so that the target wave field imaging quality is relatively high.
Owner:CHINA NAT PETROLEUM CORP +2

Anisotropic inkjet dotting method

The application provides a special-shaped ink-jet dot extraction method, relates to the fields of semiconductor manufacturing and ink-jet technology, and defines one or more first virtual rectangles according to a wafer preset unit setting; in each first virtual rectangle, the minimum circumscribed bounding box of a special-shaped pattern is extracted as a second virtual rectangle; spatial distribution sampling and step distribution sampling are performed in the second virtual rectangle to complete dot extraction processing; and the first virtual rectangle after the dot extraction processing is embedded into a corresponding position of the wafer. The two-step dot extraction method of spatial distribution sampling and step distribution sampling solves the problem of uneven vacuum lamination of the special-shaped pattern.
Owner:ZHEJIANG SEMIPEAK TECH CO LTD