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Femtosecond inteferometer for testing diffuser optical characteristic

A technology of optical properties and scatterers, which is applied in the field of femtosecond interferometers for testing the optical properties of scatterers, and can solve problems such as spectral linewidth and femtosecond holographic barriers.

Inactive Publication Date: 2006-04-05
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

However, the linewidth of femtosecond lasers is usually above 5nm, and the shorter the pulse, the wider the spectral line, which brings obstacles to many researches on femtosecond holography

Method used

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  • Femtosecond inteferometer for testing diffuser optical characteristic

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Embodiment Construction

[0026] see first figure 1 , figure 1 It is a structural block diagram of the femtosecond interferometer for testing the optical characteristics of the scatterer in the present invention. As can be seen from the figure, its composition is that it includes a femtosecond laser 1, a beam splitter 2, a five reflecting mirrors 6, 7, 8, 9, an optical delay line composed of 10, a first total reflection mirror 3, a second total reflection mirror 5, a third total reflection mirror 11, a half-transmission mirror 4, a sample chamber, a detector 12 and a calculator 13. The positional relationship of each component is as follows: a beam splitter 2 is placed on the laser output optical path of the femtosecond Ti:Sapphire laser 1, and the A beam and the B beam are output from the beam splitter 2, and the A beam passes through the second mirror 5, The optical delay line, the third mirror 11 and the half-mirror 4 enter the detector 12, while the B beam is reflected by the first mirror 3 and en...

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Abstract

The invention is a femtosecond interferometer for testing the scattering body optical characters. It includes femtosecond laser, a splitter, an optical delaying line made up of several blocks of reflectors, the first holophote, the second holophote, the third holophote, a semitransparent and half-reflection mirror, a sample chamber, a detector and a computer. The relation between each component is: a splitter is arranged on the output light path of femtosecond titanium gem laser, acquires tow beams of output beams (A, B). The beam A enters the detector through the second reflector, optical delaying line, and the third reflector and the semitransparent and half-reflection mirror; but the beam B enters the sample through the first reflector, and then is reflected into the detector through the semitransparent and half-reflection mirror, meets with the beam A and intervenes, forms a hologram, the hologram is sent to the computer after being digitalized. The invention can provide the optical character of the strong scattering body with high precision and high resolution, and provides a strong tool and researching method for biomedicine.

Description

Technical field: [0001] The invention belongs to physical testing instruments, in particular to a femtosecond interferometer for testing the optical properties of scatterers and a method for using the same, which is suitable for testing the optical properties of various strong scatterers. Background technique: [0002] Since biological tissue is a highly scattering medium, light not only absorbs but also scatters when propagating in the biological medium. The degree of absorption and scattering is related to the incident wavelength. For red light and near-infrared light with a wavelength between 600-1000nm, the absorption of tissue is the smallest, and the attenuation of light is mainly due to scattering. Experimental measurements on human tissue have shown that the mean free path of near-infrared light propagating in tissue is generally tens to hundreds of microns, depending on the incident wavelength. [0003] The mechanism of optical imaging of biological tissue is the i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/45G03H1/04
Inventor 陈建文高鸿奕朱化凤李儒新徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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