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Main control case of nanometer-particle microscope

A nanoparticle and microscope technology, applied in microscopes, optics, instruments, etc., can solve the problems of functional template interference, poor heat dissipation performance, and large space occupation.

Inactive Publication Date: 2006-06-28
上海爱建纳米科技发展有限公司
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  • Abstract
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Problems solved by technology

The main problem in the prior art is that the shielding between the high and low voltage power supply and high voltage amplifier and the functional template is poor, which makes the high and low voltage power supply and high voltage amplifier interfere with the functional template and affects its observation accuracy
At the same time, the functional modules are placed horizontally, occupying a large space, resulting in a bulky main controller, and poor heat dissipation performance, which also affects the observation accuracy

Method used

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  • Main control case of nanometer-particle microscope

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Embodiment Construction

[0007] Further illustrate the structure of main control box of the present invention below with reference to accompanying drawing.

[0008] Such as figure 1 As shown, in the box body 2, a high-voltage amplification module 1, a heat dissipation and exhaust system 3, a main control module 4, and a high-voltage and low-voltage power supply system module 7 are placed independently of each other. The high-voltage amplification module 1 and the high-low voltage power supply system module 7 are placed on both sides of the box body 2, and the main control module 4 is placed in the middle of the two. There is a first cooling channel 9 between the high-voltage amplification module 1 and the main control module 4 . There is a second cooling channel 8 between the high and low voltage power supply system module 7 and the main control module 4 . The first cooling channel 9 and the second cooling channel 8 surround the main control module 4 and communicate with the cooling and exhaust syst...

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Abstract

The invention is a kind of primary box for nano particle microscope, the box includes a high pressure amplifying model, a radiating and fan system, a primary model and a high / low voltage power system model, all of which are placed in the box independently, there has a radiating channel connected with the fan system around the primary model. The three models have relative independent electromagnetism masking structure. The functional templates are placed in the primary control model vertically in parallel. The electromagnetism masking performance is good, the irradiating effect is good, and the disturbance is small, the noise is small, the precision is higher than 0.5 nano. The whole volume is small.

Description

technical field [0001] The invention relates to a main control box of a microscope, in particular to a main control box of a nanoparticle microscope. Background technique [0002] The observation accuracy of the microscope is an important index to measure the microscope. Especially for nanoparticle microscope, the objects it observes are nanoscale particles, and its precision is required to be nanoscale. However, the key to determining the precision of the microscope lies in its main controller, also known as the main control box. In the prior art, the main controller mainly includes: high and low voltage power supplies, high voltage amplifiers, heat dissipation and exhaust systems, and functional modules placed horizontally. The main problem in the prior art is that the shielding between the high and low voltage power supply and high voltage amplifier and the functional template is poor, which makes the high and low voltage power supply and high voltage amplifier interfer...

Claims

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Application Information

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IPC IPC(8): G02B21/00G02B17/02
Inventor 李荣庆林学海
Owner 上海爱建纳米科技发展有限公司
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