Voltage allocation mode of piezoelectric scanner for scanning-probe microscope
A scanning probe and configuration technology, applied in the field of scanning probe microscopy, can solve problems such as limited dynamic range, and achieve the effects of improving stability, reducing distortion, and simplifying circuits
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[0006] It is necessary to modify or redesign the commonly used electronic control system of scanning probe microscope. In the existing scanning probe microscope electronic control system, find the sawtooth wave low-voltage signal output terminal that controls the scanning of the X electrode and changes linearly with time, which is divided into two ways: making a general positive high-voltage amplifying circuit (the working power only needs a positive High-voltage regulated power supply), which converts a signal into a positive high-voltage signal V through an amplifying circuit + , to provide voltage for the +X electrode; find the low-voltage signal output terminal that controls the scanning range in the X direction and make a general-purpose low-voltage differential circuit, and convert the other path through the low-voltage differential circuit into a low-voltage signal V + *L =V set L -V + L , and then converted into a high-voltage signal V by the amplifying circuit +...
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