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Equipment for identifying working height of device conveying system and its method

A conveying system and working height technology, applied in the field of working height devices, can solve the problems of prone to errors, reduced overall test work efficiency, and more time for working height setting.

Inactive Publication Date: 2003-09-24
MIRAE CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the input process is prone to errors and the working height setting also takes too much time
Therefore, the daily production capacity is reduced and the overall efficiency of the testing work is reduced

Method used

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  • Equipment for identifying working height of device conveying system and its method
  • Equipment for identifying working height of device conveying system and its method
  • Equipment for identifying working height of device conveying system and its method

Examples

Experimental program
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Embodiment Construction

[0028] The examples shown in the drawings will be described in detail as preferred embodiments of the present invention. The same or similar parts in each drawing use the same reference numerals as much as possible.

[0029] figure 2 Shown is a top view of a device transport system in a handler with a device for identifying working heights according to the invention.

[0030] see figure 2 , on one side of a moving block 141, a support block 143 is installed, which can move along the movable frame 14a (see FIG. 1) of the processing machine, and move up and down by a guide such as a linear motion guide rail 142. On the support block 143 is mounted a device transfer unit 15 for picking up semiconductor devices.

[0031] With the help of a ball screw 144 vertically installed on the moving block 141 and a vertical axis servo motor 145 driving the ball screw 144 , the support block 143 can move up and down along the linear motion guide rail 142 .

[0032] The device transfer uni...

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PUM

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Abstract

The invention discloses a device and method for identifying the working height of a device conveying system in a semiconductor device test handler, which uses a device with a simple structure to quickly and accurately measure and reset the working height of the semiconductor device conveying system . A device conveying system for picking up and conveying semiconductor devices is installed on a processor body and can move horizontally and vertically, and has a plurality of pickers for picking up semiconductor devices. A moving lifting block, a contact probe installed perpendicular to the lifting block and moving up and down according to the contact with the target below, a detection device for detecting the contact probe rising, and a driving device for driving the lifting block to move up and down .

Description

[0001] This application claims priority from Korean Patent Application No. P2002-13539 filed March 13, 2002, the contents of which are incorporated herein by reference. technical field [0002] The invention relates to a device for identifying the working height of a device delivery system in a semiconductor device test handler, in particular to a device and method for identifying the working height of a device delivery system in a semiconductor device test handler. When different types of semiconductor devices are in When testing in a handler, it can quickly and accurately measure and reset the working height of the device delivery system according to the type of semiconductor device and the replaced parts such as trays and change kits. Background technique [0003] Typically, semiconductor devices produced on a production line are tested before shipment to check whether they are genuine or defective. [0004] A handler is a device used to test semiconductor devices. The h...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/28H01L21/66
CPCG01R31/2851G01R31/2887G01R31/2893H01L22/00
Inventor 黄炫周
Owner MIRAE CORPORATION
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