RTL level real-time hardware testing platform in memory card and test method thereof

A technology of hardware testing and memory card, which is applied in semiconductor/solid-state device testing/measurement, electronic circuit testing, electrical components, etc. It can solve problems such as failure to find errors and low testing efficiency, and achieve reduced error factors, high efficiency, and Reduce the effect of the iterative process

Inactive Publication Date: 2005-01-19
上海华园微电子技术有限公司
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a real-time hardware testing platform and testing method of RTL level in memory card, aiming to solve the problem of human factors in the current hardware testing of RTL level in memory card. Users were unable to find this error and testing inefficiencies before

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • RTL level real-time hardware testing platform in memory card and test method thereof
  • RTL level real-time hardware testing platform in memory card and test method thereof
  • RTL level real-time hardware testing platform in memory card and test method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0022] Depend on figure 1 , figure 2 It can be seen that the test platform of the present invention includes a general memory card 1, a designed memory card 2, an emulator 3, and a PC 4; N test instructions are input to the general memory card 1 and the corresponding results are input one by one to the PC 4; N test instructions are input to the designed memory card 2 one by one, the test results are obtained by Verilog HDL or VHDL emulator 3, and the corresponding results are input to the PC 4;

[0023] The N test instructions refer to the number of test instructions corresponding to the required memory card of a certain design:

[0024] The test instruction is input to the general memory card 1 or the designed memory card 2 and the result output is to pass the basic configuration file and the detailed test file through the general memory car...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a RTL-level real-time hardware testing platform in a memory card and its testing method, the platform including a universal memory card, a designed memory card, an emulator and a PC; inputting N testing instructions one by one in the universal memory card and inputting the corresponding result into the PC; similarly, inputting N testing instructions one by one into the designed memory card, using a Verilog HDL or VHDL emulator to obtain the test result and inputting the corresponding result into the PC; the N instructions mean the needed number of the testing instructions corresponding to a certain designed memory card; comparing the two results: if they are the same, it shows the hardware of the designed memory card exact or makes real-time modification of the hardware; the invention has the beneficial effects: because it uses existing standard for testing to reduce the artificial mistake factors in designing and the iterative process of designing and the testing efficiency is higher.

Description

technical field [0001] The invention relates to an integrated circuit real-time hardware testing platform and a testing method thereof, in particular to a memory card RTL-level real-time hardware testing platform and a testing method thereof. Background technique [0002] In the forward design of integrated circuits, it is an iterative process from requirements to system division to final design verification. Among them, the verification process generally takes up 2 / 3 of the entire design time. Obviously, the verification of the design occupies a very important position in the entire integrated circuit design. It is necessary to shorten the product development cycle as much as possible, but also to ensure that the functions of the developed products are fully tested. These two are a pair of contradictions. [0003] In the front-end design of integrated circuits, the circuit diagram is generally input in the form of programming language, and the popular languages ​​include V...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G06F17/50H01L21/66H01L21/82
Inventor 郭俊曹辉印义言
Owner 上海华园微电子技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap