Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus

A line-structured light and calibration method technology, applied in the direction of optical devices, measuring devices, instruments, etc., can solve problems such as difficult to reach, difficult to extract pixel coordinates of feature points, complex target shape, etc., to achieve accurate calibration effect

Inactive Publication Date: 2005-03-16
TIANJIN UNIV
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Problems solved by technology

Due to the complex shape of the target, it is often difficult to extract the pixel coordinates of the feature points, and it is difficult to collect mo

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  • Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus
  • Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus
  • Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings and examples.

[0026] figure 1 It is a new type of parallel linear array planar target designed by us. The target is to accurately describe a group of horizontal array straight lines on the plane plate, and the distance between the straight lines is fixed as d y , there are two other parallel straight lines on both sides of a straight line in the middle with a distance of d s , and d s y , defining it as a marked line. Such as figure 2 As shown, the target is fixed on a moving guide rail during calibration, and the target plane is perpendicular to the moving direction of the guide rail through adjustment, and the guide rail is adjusted to ensure that the target plane is perpendicular to the projection laser plane. The laser is projected onto the target surface to generate a light strip, and the light strip is adjusted to ensure that the light strip is perpendicular ...

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Abstract

This invention relates to laser high-accuracy three-dimensional coordinate measurement, which in detail relates to a binocular structure photo-sensor compatibility calibration and its operation apparatus. In order to calibrate the photo plane parameters of the binocular structure photo-sensor, it unites the space coordinates measured of the left and right cameras. The technique project adopted in this invention is the following: the operation apparatus comprises left and right cameras, laser machine, and target and also movable guide rail with the target fixed on; the target plane is vertical to the moving direction of the guide rail which ensures the plane is vertical to the project laser plane. Besides, it is to identify the axis coordinates in the space coordinate system of the cross points of the each lines and photo bars in the target and brings the coordinates to the photo-sensor mathematical model for computation and get sensor parameters.

Description

technical field [0001] The invention relates to laser high-precision three-dimensional coordinate measurement, and in particular relates to a consistent and precise calibration method of a binocular line structured light sensor and an implementation device thereof. Background technique [0002] Line-structure laser vision measurement technology is a high-precision three-dimensional coordinate measurement method. The line-structure laser is projected on the surface to be measured to generate a light strip. The camera captures the light strip image and extracts the pixel coordinates distributed on the light strip image (u i , v i ), and then deduce the spatial three-dimensional coordinate data of the corresponding point on the light bar through a certain transformation. [0003] The line structure laser sensor measurement model includes many transformation parameters, one of which defines the transformation relationship between the sensor’s spatial measurement coordinate syst...

Claims

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Application Information

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IPC IPC(8): G01B9/00G01B11/03
Inventor 孙长库陶立张效栋
Owner TIANJIN UNIV
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