Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- TIANJIN UNIV
- Publication Date
- 2005-03-16
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to laser high-precision three-dimensional coordinate measurement, and in particular relates to a consistent and precise calibration method of a binocular line structured light sensor and an implementation device thereof. Background technique
[0002] Line-structure laser vision measurement technology is a high-precision three-dimensional coordinate measurement method. The line-structure laser is projected on the surface to be measured to generate a light strip. The camera captures the light strip image and extracts the pixel coordinates distributed on the light strip image (u i , v i ), and then deduce the spatial three-dimensional coordinate data of the corresponding point on the light bar through a certain transformation.
[0003] The line structure laser sensor measurement model includes many transformation parameters, one of which defines the transformation relationship between the sensor’s spatial measurement coordinate syst...