Semiconductor laser ageing method

A semiconductor and laser technology, applied in the field of semiconductor laser aging detection methods and the equipment used, can solve the problems of aging, LD overcurrent aging, affecting life and other problems

Inactive Publication Date: 2005-05-25
惠州市中科光电有限公司
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  • Abstract
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Problems solved by technology

[0003] In addition, in the traditional aging method, in order to reduce the LD damage caused by the above-mentioned debugging, a constant current aging method is also adopted, that is, a constant current is applied to all LDs for aging. The large distribution range of LD operating current will cause over-current aging of some LDs (that is, the set constant current value is greater than its operating current value) to affect its life, while the other part of LDs work in an undersaturated state (that is, the set constant current value) The constant current value is less than its working current value) so that it does not have the effect of aging

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Embodiment Construction

[0009] The idea of ​​the present invention is: in the application of the semiconductor laser LD, it is always required that the LD can work at a constant power, so a constant power control circuit must be provided. Before LD is applied to actual products, in order to ensure the life of LD application products and the quality of LD in the application process, it is always hoped that LD can be aged in a constant power control circuit similar to its application, and it is more hoped that the aging power The working power is the same as the actual application or the aging power is higher than the actual application. At the same time, in order to be closer to the actual working conditions of the LD and to protect the LD, no adjustment can be made during the aging process (it will not always be adjusted in the actual application of the LD).

[0010] In order to meet the above requirements, people can of course directly use the constant power control circuit or a circuit close to the...

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Abstract

A multi-channel semiconductor laser aging method, the semiconductor laser diodes LD are installed one by one on the multi-channel LD test and aging fixture, and the fixture is connected with a multi-channel constant power control circuit equipped with a power supply and connected with a central analysis and control computer; The computer first tests the constant power resistor that matches a certain LD on the fixture, and then connects the power control circuit unit that matches the LD in the multi-channel constant power control circuit, so that the LD is in the same or similar condition as the actual working condition. Aging is carried out in an environment, and then the remaining LDs to be tested are subjected to the aforementioned steps one by one. Most of the equipment used in the present invention is the transformation of existing equipment, which makes the circuit of the equipment simpler, more reliable, and more convenient to operate. It can be aged only by connecting the power supply; the aging efficiency is high, and the aging result is more accurate and practical; It is free of debugging and works with constant power, so that the LD will not be damaged.

Description

technical field [0001] The invention relates to a semiconductor device detection method, in particular to a semiconductor laser aging detection method and equipment used therein. Background technique [0002] The aging of semiconductor lasers (hereinafter referred to as LD) is a production inspection process that manufacturers must go through before leaving the factory. Only LDs that have passed aging screening can ensure their quality and service life. There are many traditional laser aging screening methods and equipment, such as the U.S. "5172365" patent discloses a laser life testing system, and the applicant's patent application number "01129827.8" also discloses a laser aging screening equipment and screening method . The aging process scheme disclosed in these patents is: install the laser on a special fixture → adjust the potentiometer or change the value of the D / A conversion to change the working current of the laser → detect the power and other parameters of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26H01L21/66H01S5/00
Inventor 何德毅唐宽平马军
Owner 惠州市中科光电有限公司
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