Semiconductor laser ageing method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 惠州市中科光电有限公司
- Publication Date
- 2005-05-25
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a semiconductor device detection method, in particular to a semiconductor laser aging detection method and equipment used therein. Background technique
[0002] The aging of semiconductor lasers (hereinafter referred to as LD) is a production inspection process that manufacturers must go through before leaving the factory. Only LDs that have passed aging screening can ensure their quality and service life. There are many traditional laser aging screening methods and equipment, such as the U.S. "5172365" patent discloses a laser life testing system, and the applicant's patent application number "01129827.8" also discloses a laser aging screening equipment and screening method . The aging process scheme disclosed in these patents is: install the laser on a special fixture → adjust the potentiometer or change the value of the D / A conversion to change the working current of the laser → detect the power and other parameters of the ...