Fault filling method and apparatus based on programmable logical device
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HUAWEI TECH CO LTD
- Publication Date
- 2006-03-01
- Estimated Expiration
- Not applicable Β· inactive patent
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Abstract
Description
technical field
[0001] The invention relates to electronic equipment, in particular to a fault injection method and device based on programmable logic devices. Background technique
[0002] With the development of testing technology, fault-tolerant testing has been paid more and more attention.
[0003] The purpose of fault-tolerant testing is to determine the impact of faults on the system and the ability of the system to automatically return to normal after the fault is restored.
[0004] Therefore, generating the fault signal required for fault-tolerance testing is a very necessary step in the process of fault-tolerance testing.
[0005] Fault injection technology is a technology gradually developed to meet the needs of fault-tolerant testing.
[0006] Due to the advantages of powerful programmable performance, high-speed processing speed, and numerous pins in today's electronic product design, programmable logic devices are widely used in clock generation, synchronizat...