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Fault filling method and apparatus based on programmable logical device

A technology of fault injection and programming logic, which is applied in the direction of responding to errors, etc., can solve problems such as low automation, high cost of fault injection, and damage to programmable logic devices, so as to avoid electrical damage and meet the needs of fault-tolerant design and testing. Improve the effect of controllable management and automation

Inactive Publication Date: 2006-03-01
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0014] The object of the present invention is to provide a fault injection method and device based on a programmable logic device, by setting a fault injection module in the programmable logic device, to overcome the high cost of fault injection in the prior art, easy to program Damage caused by logic devices, low degree of automation and other disadvantages

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  • Fault filling method and apparatus based on programmable logical device
  • Fault filling method and apparatus based on programmable logical device
  • Fault filling method and apparatus based on programmable logical device

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Embodiment Construction

[0049] The core of the present invention is: a fault injection module is installed inside the programmable logic device that needs fault injection, and the signal of the programmable logic device is obtained, and the fault injection module injects a corresponding fault into the obtained signal, and outputs the signal after the fault injection.

[0050] The technical solution provided by the present invention will be further described below based on the core idea of ​​the present invention.

[0051] The fault injection module built in the programmable logic device of the present invention can automatically inject corresponding faults into the signals in the programmable logic device according to the test requirements, and the signals in the programmable logic device include signals generated inside the programmable logic device and external inputs Signals in Programmable Logic Devices.

[0052] Setting fault injection module in programmable logic device to realize the principle...

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Abstract

The present invention provides a fault injection method based on programmable logic device and its device. Its kernel lies in that a fault injection module is set in the interior of programmable logic device having need of making fault injection to obtain the signal of the described programmable logic device, the described fault injection module can inject the correspondent fault into the obtained signal and can output the signal in which the fault is injected. Said invention has no need of external fault injection equipment or scrambling equipment, and can utilize the fault injection module set in the interior of programmable logic device to make fault injection process have no need of manual intervention and do not damage the programmable logic device.

Description

technical field [0001] The invention relates to electronic equipment, in particular to a fault injection method and device based on programmable logic devices. Background technique [0002] With the development of testing technology, fault-tolerant testing has been paid more and more attention. [0003] The purpose of fault-tolerant testing is to determine the impact of faults on the system and the ability of the system to automatically return to normal after the fault is restored. [0004] Therefore, generating the fault signal required for fault-tolerance testing is a very necessary step in the process of fault-tolerance testing. [0005] Fault injection technology is a technology gradually developed to meet the needs of fault-tolerant testing. [0006] Due to the advantages of powerful programmable performance, high-speed processing speed, and numerous pins in today's electronic product design, programmable logic devices are widely used in clock generation, synchronizat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07
Inventor 高俊恩
Owner HUAWEI TECH CO LTD
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