Method for eliminating error of Shack Hartmann wavefront sensor model

A wavefront sensor, model error technology, applied in instruments, scientific instruments, measuring devices, etc., can solve problems such as model errors
CN1793805AInactive Publication Date: 2006-06-28INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Publication Date
2006-06-28
Estimated Expiration
Not applicable · inactive patent

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Abstract

A method for eliminating model error of Shack ¿C Hartman wave ¿C front transducer includes calculating error revision matrix according to type and layout of light beam dividing element used by Shack ¿C Hartman wave ¿C front transducer, calculating inverse matrix of error revision matrix, acting error revision inverse matrix on actual measured result of Shack ¿C Hartman wave ¿C front transducer for eliminating model error.
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Description

technical field

[0001] The invention relates to a method for eliminating model errors of Shack-Hartmann wavefront sensors. Background technique

[0002] Currently widely used wavefront sensors include shearing interferometers and Shack-Hartmann wavefront sensors. Shearing interferometers were widely used in early adaptive optics. In 1974, J.W.Hardy et al. first used transverse shearing interferometers to measure the wavefront phase distortion affected by atmospheric turbulence; in the later period, Shack-Hartmann wave Front sensors are gradually becoming the most commonly used wavefront sensors in adaptive optics systems. For example, the SWAT wavefront sensor established by Lincoln Laboratory in the United States in the late 1980s.

[0003] The reason why the Shack-Hartmann wavefront sensor is widely used is that the Shack-Hartmann wavefront sensor has many advantages that the shearing interferometer does not have. The shearing interferometer has low light energy utiliza...

Claims

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