5 results about "Shack–Hartmann wavefront sensor" patented technology

The invention discloses a deep learning wavefront phase reconstruction method for a Shack-Hartmann wavefront sensor with a flexible reference base point, and belongs to the technical field of wavefront detection. The method comprises the following steps: constructing a simulation data set containing error-free and error-containing image pairs by simulating atmospheric turbulence wavefront distortion, sensor camera position errors, system non-common-path errors and a deformable mirror influence function; constructing a two-arm CSwinUnet network, taking the image pair as input, and outputting a wavefront phase error; the network adopts a CSwinin-Transform block and a cross attention mechanism to extract features, and multi-scale information is fused in combination with jump connection; before training, threshold processing and normalization are carried out on an image, and an Adam optimizer and a mean square error loss function are adopted for training. According to the method, high-precision and high-resolution wavefront reconstruction can be realized, the method has millisecond-level operation speed, and the wavefront detection capability of the adaptive optical system is remarkably improved.

The invention relates to a wavefront measurement method based on a modulation type Shack-Hartmann wavefront sensor, the modulation type Shack-Hartmann wavefront sensor comprises a composite laminated modulation device and a detector, and the composite laminated modulation device is composed of a microlens array and a binary random coding mask. The method comprises the following steps: acquiring a composite diffraction pattern which is collected by a detector and is coherently modulated by a composite laminated modulator; wherein the composite diffraction pattern has diffraction texture features, and the diffraction texture features are obtained by coding after coherent modulation is carried out on high-frequency phase information through a binary random coding mask; reconstructing a high-frequency complex wavefront based on the diffraction texture features by adopting a coherent modulation phase recovery algorithm; and outputting the high-frequency complex wavefront as a wavefront measurement result. According to the scheme provided by the invention, unified measurement of high spatial resolution and wide dynamic range can be realized under the condition of single exposure, so that the inherent limitation of the SHWFS between the spatial resolution and the dynamic range in the related technology is broken through.

An adaptive optics system is provided using a nonuniform Shack-Hartmann wavefront sensor (NSHWS) including an array of nonuniform lenslets, with an orthogonal polynomial used to determine a size and a placement for each lenslet and an array of detectors located in a focal plane of the array of nonuniform lenslets with a detector corresponding to each lenslet.

The invention relates to a planeness measurement system and method based on a Shack-Hartmann wavefront sensor, relates to the technical field of optical measurement, and solves the technical problems of high cost, environmental sensitivity and low vibration robustness in a planeness measurement method in the prior art. The measuring system comprises a light source module, a variable light attenuation module, a beam expanding module, a test element loading module and an imaging detection module which are sequentially arranged in the light path direction. According to the flatness measurement system based on the Shack-Hartmann wavefront sensor, the Shack-Hartmann wavefront sensor is adopted to replace a laser interferometer to carry out surface type detection on the surface of an optical element, height information of the surface is deduced through obtained phase data, and therefore flatness measurement is obtained. The flatness measurement method based on the Shack-Hartmann wavefront sensor has the advantages of high precision, large wavefront dynamic range, rapid real-time detection and the like, and has a wide application prospect.

The present application relates to a kind of complete phase reconstruction methods based on Shack-Hartmann wavefront sensor, belong to laser communication, imaging and adaptive optics field.The present application obtains light intensity information and phase gradient information using Shack-Hartmann wavefront sensor;Phase singularity position is detected by calculating the ratio of second moment beam width and diffraction limit point diameter;Phase singularity rotation direction is judged using phase gradient loop summation;Complex plane is established with the center of detection surface as origin and the implicit phase is reconstructed by complex logarithm operation;Complete wavefront phase is obtained by combining the implicit phase with the continuous phase fitted by Zernike polynomial.The present application aims to solve the fundamental defect that existing Shack-Hartmann wavefront sensor cannot measure vortex phase when measuring wavefront containing phase singularity, and can realize the accurate reconstruction of complete wavefront phase information containing implicit phase.