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Hartmann wavefront reconstruction method matched with micro-scanning device

A matching and micro-scanning technology, applied in the field of image processing, can solve the problem that it is difficult to make up for insufficient wavefront sampling, and achieve the effect of increasing the sampling rate

Inactive Publication Date: 2018-10-16
CHANGCHUN UNIV OF SCI & TECH
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Problems solved by technology

In the case of large-aperture wavefront detection and complex wavefront shapes, it is difficult to compensate for the problem of the measured wave caused by the size limitation of the microlens by simply improving the spot centroid positioning accuracy, wavefront reconstruction algorithm, and microlens array parameters. Disadvantages of insufficient pre-sampling

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Embodiment Construction

[0015] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0016] A Hartmann wavefront reconstruction method matched with a micro-scanning device provided in an embodiment of the present invention, the method includes the following steps:

[0017] In step 100, using the iterative weighted centroid algorithm for the reconstructed spot distribution map to obtain the four sets of spot centroid coordinates A, B, C, and D, the offsets Δx and Δy of the spot centroid in the x-direction and y-direction can be obtained :

[0...

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Abstract

The invention discloses a Hartmann wavefront reconstruction method matched with a micro-scanning device, and relates to the field of image processing technology. Starting from the basic research of the Shack-Hartmann wavefront detection and reconstruction technology and the micro-scanning technology, a new detection method for adding a micro-scanning device before a microlens array is proposed. The micro-scanning method is used to compensate for the shortcomings of the traditional Shack-Hartmann wavefront sensor for to-be-tested wavefront sampling, and the micro-scanning technology is used toimprove the sampling rate of the tested wavefront, so that a high-resolution spot distribution image is obtained, and the tested wavefront is better recovered.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a Hartmann wavefront reconstruction method matched with a micro-scanning device. Background technique [0002] The Shaker-Hartmann sensor is a real-time wavefront measuring instrument based on measuring the wavefront slope of the incident light. It has the advantages of simple structure, good real-time performance, and less environmental influence. It has been widely used in adaptive optics, laser beam quality diagnosis, space laser communication, human eye aberration analysis, optical component quality inspection and optical system adjustment and other fields. In the case of large-aperture wavefront detection and complex wavefront shapes, it is difficult to compensate for the problem of the measured wave caused by the size limitation of the microlens by simply improving the spot centroid positioning accuracy, wavefront reconstruction algorithm, and microlens array param...

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Application Information

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IPC IPC(8): G01J9/00
CPCG01J9/00
Inventor 马辰昊宫平付跃刚李清亮王加科
Owner CHANGCHUN UNIV OF SCI & TECH
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