Handler for testing semiconductor devices

Abstract

A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading / unloading semiconductor devices in / from test trays, and greatly increasing the number of simultaneously testable semiconductor devices. The handler includes a loading station, an unloading station, test trays, an exchanging station comprising a horizontal moving unit for horizontally moving a selected one of the test trays by a predetermined pitch at a working place, a test station in which at least one test board having a plurality of test sockets to be electrically connected with semiconductor devices is mounted, the test station performing a test while connecting the semiconductor devices in one of the test trays, which is fed from the exchanging station to the test station, to the test sockets, device transfer units for transfer the semiconductor devices between the loading station and the exchanging station and between the exchanging station and the unloading station, respectively, and a tray transfer unit for transfer the test trays between the exchanging station and the test station.

Description

[0001] This application claims priority from Korean Patent Applications 2004-23621 and 2004-23622, both of which were filed on March 22, 2004, the entire contents of which are hereby incorporated by reference. technical field [0002] The present invention relates to a processor for testing semiconductor devices, in particular to a processor for testing semiconductor devices that connects semiconductor devices to test sockets. The test sockets are connected to external testing equipment so that semiconductor devices can be tested, and based on the test Classify the tested semiconductor devices according to the results, and then store the classified semiconductor devices. Background technique [0003] Typically, memory or non-memory semiconductor devices or modular ICs, each containing memory or non-memory components suitably arranged on a substrate to form a circuit, are subjected to various tests after fabrication and before shipment. Semiconductor device. Such testing req...

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Problems solved by technology

Moreover, the components of the test chamber where the test board is installed, such as guide rails and actuators that guide the movement of the test tray, cannot be changed at will

As a result, this traditional handler is not compatible with both 64-para test boards and 128-para test boards

Therefore, such conventional handlers must perform tests with a single fixed carrier spacing

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