Data acquisition apparatus

Abstract

The invention relates to a data collect device, uses to collect the output data of internal module of chip, wherein it comprises at least one data collect module; the data collect module comprises several input ports for inputting the output data of internal module, a complex module for multi-path complexing the output data of internal module, a control module for controlling the complex module to output one-path data; an internal circuit state collect input port for collecting the internal circuit state data; the control module controls the complex module to multi-path complex the output data of internal module input from several input ports and the internal circuit state data input from the internal circuit state collect input port; the output data of internal module and the internal circuit state data share at least one data collect module.

Description

technical field [0001] The invention relates to a data collection device, which is used for collecting originally invisible data inside a chip and circuit state data, so as to improve the efficiency of chip verification. Background technique [0002] SoC (System on a Chip) technology has become the development trend of today's VLSI. It integrates the functions completed by many chips into one chip. But SoC is not a simple superposition of the functions of each chip, but starts from the functions and performance of the entire system, uses a combination of software and hardware design and verification methods, and uses IP multiplexing and deep submicron technology to realize complex functions on a chip. Although SoC technology can provide efficient solutions for designing more complex products and shorten the time to market of microelectronic products, due to the large scale and complex functions of SoC chips, the difficulty of simulation verification in the design process is ...

AI Technical Summary

Problems solved by technology

If multiple interval photography technology is adopted (scanning the state of the circuit at a certain time interval, that is, multi-snapshot), it is generally only necessary to perform interval scanning during the operation of a test program, and it is sufficient to perform interval scanning during the other several repetitions of the test program. During operation, the data uploading channel of the circuit state scanning circuit cannot be utilized; It is uploaded to two PCs through a specific interface (such as USB), and one channel of data corresponds to one PC. Obviously, from the perspective of hardware costs and full utilization of data upload channels, it is very wasteful for the circuit status scanning circuit to monopolize one data upload channel.

Images