Method for real-time generating flash-storage testing vector

A technology of test vectors and flash memory, which is applied in the direction of measuring electricity, measuring devices, semiconductor/solid-state device testing/measurement, etc. It can solve problems such as poor reusability, high writing complexity, and poor reliability, so as to shorten the generation time and improve The degree of reuse and the effect of shortening the development time

Inactive Publication Date: 2007-06-20
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

This kind of software has the disadvantages of high writing complexity, poor reusability, poor reliability, and weak portability

Method used

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  • Method for real-time generating flash-storage testing vector

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Embodiment Construction

[0009] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0010] The test operation of the flash memory (flash) generated by the library function in the present invention can be divided into three parts: erasing, reading and writing. The setting of library functions is also mainly divided into three categories, which can be written in the following function formats.

[0011] The three library function formats for parallel output flash can be written as:

[0012] int *P_ER(int ctr_pin, r, long int er_time);

[0013] int*P_PGM(int ctr_pin, long int start_adr, long intend_adr, int pgm_time, int*srcdata);

[0014] int*P_RD(int ctr_pin, long int start_adr, long intend_adr, int *fetdata)

[0015] Among the above functions, int*P_ER(int ctr_pin, long int er_time) indicates the library function used for erasing, where ctr_pin indicates the control state setting of the control pin, and er_time indicates the erasing time s...

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Abstract

A method for generating flash memory test vector in real time includes compiling erasing operation, reading operation and writing operation of flash memory separately to be erasing library function, reading library function and writing library function of flash memory in advance then calling these library functions to generate test vectors on real time in test.

Description

technical field [0001] The invention relates to a semiconductor device testing method, in particular to a method for generating test vectors in the semiconductor device test. Background technique [0002] In the field of semiconductor testing, whether the test and evaluation of products is correct or not is related to the correct analysis of product failure, and plays a key role in the development and mass production of products; the early completion of test and evaluation wins time for products to be introduced to the market. The basis of test evaluation lies in the development of test programs, and the timeliness and reliability of test program development are key issues. Sometimes the time to launch the product to the market is often missed due to the long delay in the product testing and evaluation stage. [0003] Designing and developing test vectors is a difficult point in flash memory testing. After the test vector is designed, it needs to go through the debugging a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/00H01L21/66
Inventor 谢晋春武建宏
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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