Substrate treatment method and substrate treatment apparatus
Patent Information
- Authority / Receiving Office
- US ยท United States
- Current Assignee / Owner
- TOKYO ELECTRON LTD
- Publication Date
- 2005-11-24
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The present invention relates to a substrate treatment method and a substrate treatment apparatus.
[0003] 2. Description of the Related Art
[0004] In fabrication processes of semiconductor devices, a resist coating treatment is performed in which a resist solution is supplied to, for example, a semiconductor wafer (hereafter referred to as a โwaferโ) to form a resist film on the front face of the wafer.
[0005] This resist coating treatment is normally performed in a resist coating unit. The resist coating unit is provided with a nozzle for supplying a predetermined amount of the resist solution to the wafer. The nozzle is connected to a storage tank, which is a supply source of the resist solution, via a pipe. This pipe is provided with, for example, a pump for feeding the resist solution by pressure, a filter for removing impurities, an open / close valve for controlling discharge of the resist solution, and so on. T...