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Meta materials integration, detection and spectral analysis

a technology of metal materials and spectral analysis, applied in the field of metal materials, spectral analysis and electromagnetic radiation detection, can solve problems such as difficult processing and ghz-thz frequency ranges

Inactive Publication Date: 2012-09-27
PHYSICAL LOGIC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Performing processing on the detected information in the GHz-THz frequency ranges (In current systems it is extremely difficult to perform processing in the GHz-THz frequency ranges due to computational power limitations.

Method used

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  • Meta materials integration, detection and spectral analysis
  • Meta materials integration, detection and spectral analysis
  • Meta materials integration, detection and spectral analysis

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Embodiment Construction

[0023]Referring to FIGS. 1 through 7, wherein like reference numerals refer to like components in the various views, there is illustrated therein a new and improved Meta Materials Integration, Detection and Spectral Analysis, generally denominated 100 herein.

[0024]Metamaterials are basic materials with artificial molecular structure, designed to intentionally alter the basic material properties including the electromagnetic properties of the material. Some examples of metamaterials are terahertz (THz) and optical-magnetic structures, as well as lenses for microwave frequencies with a shorter focal length than conventional lenses but having the same radius of curvature.

[0025]The following publications are incorporated herein by reference: 1. Yen T. J. et al., “Terahertz Magnetic Response from Artificial Materials,” Science, 2004, vol. 303, pp. 1494-1496; 2. Grigorenko A. N et al., “Nanofabricated Media with Negative Permeability at Visible Frequencies,” Nature, 2005, vol. 438, pp. 33...

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Abstract

A detector and modulator of electromagnetic radiation is 3-dimensional structure made of substantially 2 dimensional high impedance metamaterial surfaces stacked one above the other with a dielectric layer in between and located above a conducting ground plane. Each 2 dimension surface may be formed by an open continuous conductive trace, such as metallic wire or a printed circuit line, which is cast or plated on or into a 2-D periodic arrangement of an element that belongs to the Hilbert space filling curves.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]The present application claims priority to the U.S. provisional patent applications having application Ser. Nos. 60 / 914,787 (for “Meta Materials Based Phase Discrimination Analysis”) and 60 / 914,798 (for “Pulse Compression and Expansion In Meta Materials”), both of which were filed on Apr. 30, 2007, and are now both incorporated herein by reference.BACKGROUND OF INVENTION[0002]This invention relates generally to the fields of metamaterials, spectral analysis and electromagnetic radiation detection, and more specifically to the use of metamaterials for the detection and spectral analysis of electromagnetic radiation.[0003]Another aspect of the invention relates generally to the fields of metamaterials and wave analysis, and more specifically to phase discrimination analysis on a monochromatic waveform utilizing metamaterials.[0004]Still a further aspect of the invention relates generally to the fields of metamaterials and wave analysis, and...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01J1/42
CPCH01Q15/0086
Inventor AXELROD, NOELLICHTENSTEIN, AMIROFEK, ERAN
Owner PHYSICAL LOGIC
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