Bumping process and structure thereof

Abstract

A bumping process includes providing a silicon substrate; forming a titanium-containing metal layer on silicon substrate, the titanium-containing metal layer comprises a plurality of first areas and a plurality of second areas; forming a first photoresist layer on titanium-containing metal layer; patterning the first photoresist layer to form a plurality of first opening slots; forming a plurality of copper bumps within first opening slots, said copper bump comprises a first top surface and a first ring surface; removing the first photoresist layer; forming a second photoresist layer on titanium-containing metal layer; patterning the second photoresist layer to form a plurality of second opening slots; forming a plurality of bump isolation layers at spaces, the first top surfaces and the first ring surfaces; forming a plurality of connective layers on bump isolation layers; removing the second photoresist layer, removing the second areas to form an under bump metallurgy layer.

Description

FIELD OF THE INVENTION[0001]The present invention is generally related to a bumping process and structure thereof, which particularly relates to the bumping process which improves manufacturing yield.BACKGROUND OF THE INVENTION[0002]Modern electronic products gradually lead a direction of light, thin, short, and small. Accordingly, the layout density of interior circuit for electronic product becomes more concentrated consequentially. However, a short distance between two adjacent electronic connection devices makes a short phenomenon easily occurred in circuit layout.SUMMARY[0003]The primary object of the present invention is to provide a bumping process comprising the steps of providing a silicon substrate having a surface, a plurality of bond pads disposed on said surface, and a protective layer disposed on said surface, wherein the protective layer comprises a plurality of openings, and the bond pads are revealed by the openings; forming a titanium-containing metal layer on the ...

AI Technical Summary

Benefits of technology

The present invention provides a bumping process on a silicon substrate with a protective layer and multiple bond pads. The process involves forming a titanium-containing metal layer on the substrate, patterning it to form openings, and then filling the openings with copper bumps. A second photoresist layer is then patterned to form additional openings, which are filled with bump isolation layers and connective layers. Finally, the second photoresist layer is removed and the unprotected areas of the titanium-containing metal layer are removed to create an under bump metallurgy layer. This process prevents short circuits between adjacent copper bumps and increases circuit layout density on the silicon substrate.

Problems solved by technology

However, a short distance between two adjacent electronic connection devices makes a short phenomenon easily occurred in circuit layout.

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