Methods and systems for metal artifact reduction in spectral ct imaging

Active Publication Date: 2016-11-10
GENERAL ELECTRIC CO
View PDF0 Cites 33 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0005]In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection

Problems solved by technology

In some cases, the presence of metal (e.g., in the form of metal implants, dental fillings, and so on) may interfere with the x-ray attenuation, thereby causing metal artifacts in reconstructed images.
However, a simple application of know

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Methods and systems for metal artifact reduction in spectral ct imaging
  • Methods and systems for metal artifact reduction in spectral ct imaging
  • Methods and systems for metal artifact reduction in spectral ct imaging

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018]The following description relates to various embodiments of image reconstruction for dual energy spectral imaging. In particular, methods and systems for metal artifact reduction are disclosed. The operating environment of the present invention is described with respect to a sixty-four-slice computed tomography (CT) system, such as the CT imaging system shown in FIGS. 1-4. As described herein above, the presence of metal in an object being imaged (e.g., a patient, packages, etc.) may interfere with x-ray attenuation during CT imaging, thereby leading to metal artifacts in reconstructed images of the object. In dual or multi-energy CT imaging, multiple projection datasets may be acquired, where each projection dataset corresponds to a different acquisition energy. A method for dual or multi-energy imaging, such as the method depicted in FIG. 5, may include applying a metal artifact reduction algorithm to the multiple projection datasets, where the application of the metal artif...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Various methods and systems for spectral computed tomography imaging are provided. In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection datasets based on the location of the metal, and displaying an image reconstructed from the corrected first and second projection datasets. In this way, metal artifacts may be substantially reduced in dual or multi-energy CT imaging.

Description

FIELD[0001]Embodiments of the subject matter disclosed herein relate to diagnostic imaging, and more particularly, to metal artifact reduction for dual energy spectral computed tomography (CT) imaging.BACKGROUND[0002]Dual or multi-energy spectral computed tomography (CT) systems can reveal the densities of different materials in an object and generate images acquired at multiple monochromatic x-ray energy levels. In the absence of object scatter, a system derives the behavior at a different energy based on a signal from two regions of photon energy in the spectrum: the low-energy and the high-energy portions of the incident x-ray spectrum. In a given energy region of medical CT, two physical processes dominate the x-ray attenuation: Compton scattering and the photoelectric effect. The detected signals from two energy regions provide sufficient information to resolve the energy dependence of the material being imaged. Detected signals from the two energy regions provide sufficient in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): A61B6/00G06T11/00A61B6/03
CPCA61B6/5258A61B6/482G06T2207/10081A61B6/032G06T11/008A61B6/461G06T11/005G06T2211/408
Inventor SEN SHARMA, KRITIGAO, HEWEIPAL, DEBASHISH
Owner GENERAL ELECTRIC CO
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap