Radio-frequency circuit

Abstract

Disclosed is a radio-frequency (RF) circuit capable of performing an RF characteristic test in a test mode. The RF circuit includes: a test signal generator generating a test signal; an RF receiver, coupled to the test signal generator, transmitting the test signal and thereby generating a receiver analog signal; a coupling circuit transmitting the receiver analog signal to an RF transmitter in the test mode; the RF transmitter transmitting the receiver analog signal and thereby generating a transmitter analog signal; a test result generator, coupled between the RF transmitter and a test result output terminal, including a signal converter for generating a converted signal according to the transmitter analog signal in the test mode, wherein the output signal at the test result output terminal is the converted signal or originated therefrom and relates to the result of the RF characteristic test.

Description

BACKGROUND OF THE INVENTION1. Field of the Invention[0001]The present disclosure relates to a radio-frequency (RF) circuit, especially to an RF circuit capable of performing an RF characteristic test.2. Description of Related Art[0002]Generally, a pure radio-frequency (RF) circuit doesn't include a digital baseband circuit, analog-to-digital converter (ADC), and digital-to-analog converter (DAC) and can't perform an RF characteristic test alone. Therefore, the current techniques can't measure the RF characteristics of a pure RF circuit with a chip / die probing test (CP test) in an early stage when this pure RF circuit is still a chip / die. In addition, the equipment for a general CP test is low end equipment, and such equipment is used for measuring direct-current (DC) characteristics but is incapable of measuring RF characteristics. In light of the above, the current techniques usually test a pure RF circuit after it is packaged and included in a device including an ADC and DAC, and ...

AI Technical Summary

Benefits of technology

The present patent is for a radio-frequency circuit that can do a test on its own without needing to use expensive equipment or high-end RF tools. This makes it easier and more cost-effective to perform RF characteristic tests.

Problems solved by technology

Therefore, the current techniques can't measure the RF characteristics of a pure RF circuit with a chip / die probing test (CP test) in an early stage when this pure RF circuit is still a chip / die.

In addition, the equipment for a general CP test is low end equipment, and such equipment is used for measuring direct-current (DC) characteristics but is incapable of measuring RF characteristics.

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