Device for writing and reading data by using cantilever

Abstract

Device for writing and reading a data including a floated cantilever part connected to a support, a resistively heated tip at an end of the cantilever part, and a piezoelectric sensor formed on the cantilever part, thereby preventing an occurrence of a sensing error by reading a data and reducing power consumption by using a piezoelectric sensor, and tip wear by making heights of the cantilever array uniform by using piezoelectric actuators.

Description

[0001]This application claims the benefit of the Korean Application No. P2002-14633 filed on Mar. 19, 2002, which is hereby incorporated by reference.BACKGROUND OF THE INVENTION[0002]1. Field of the Invention[0003]The present invention relates to a device for writing and reading data by using a cantilever, and more particularly, to a device for writing and reading data by using a cantilever, in which a resistively heated tip is used in writing data and a piezoelectric-sensor is used in reading data, for prevention of sensing error and reduction of a power consumption, and piezoelectric actuator array makes the height of cantilever array be uniform, for prevention of wear of a tip.[0004]2. Background of the Related Art[0005]In general, an Atomic Force Microscopy (AFM) measures a surface form and the like by using a micron cantilever. The cantilever has a tip of a few nm size at an end thereof, for measuring an atomic force between the tip and a specimen for detecting the surface form...

AI Technical Summary

Benefits of technology

[0017]An object of the present invention is to provide a device for writing and reading data by using a cantilever, in which a resistively heated tip is used in writing data and a piezoelectric-sensor is used in reading data, for prevention of sensing error and reduction of a power consumption, and the piezoelectric actuator array makes the height of cantilever array be uniform, for prevention of wear of a tip.

Problems solved by technology

First, the parallel cantilever array for faster AFM data storage is liable to cause failure in forming uniform heights of the cantilever tips due to deviations of layers of SOI substrates, and etching, which in turn causes deviations between the recording medium and the cantilever tips.

80 nm, significantly greater than a depth of the data storage recess of 40 nm, that deteriorates a reliability of the AFM data storage, and causes a serious wear down problem.

Second, the array of cantilevers require to have uniform heater platforms.

If resistances of the heaters are not uniform, a reading reliability can not be secured.

350° C. for detecting change of resistance of the heater platform and reading a data consumes much power, and, in the case of the array of the cantilevers, the power consumption is much higher as hundreds of heaters are heated at the same time.

Since the nano data storage of the AFM principle is mostly for application to portable apparatuses, the high power consumption is a big disadvantage.

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